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TEM Biasing Nano-Manipulator Sample Holder

Operando heating, biasing under environmental conditions

Technical Specs
1800 Series
Coarse Movement Range:
X axis
> 1000 µm
Y and Z axes
500 – 1000 µm
Fine Movement Range:
X axis
2 – 3 µm
Y and Z axes
~ 40 µm
Electrical Contacts
2 standard (3 – 7)*
Current Resolution
100 pA standard (< 10 pA)*
Sample Compatibility
3 mm half grids, FIB lift-out grids, or custom*
Instrument Type
TEM

Available For:

Create site-specific electrical contacts inside the TEM to study nanoscale devices, battery materials, nanowires, and 2D materials while correlating electrical measurements with real-time TEM/STEM characterization

Key Features and Capabilities

Intuitive Hardware and Software Control

Control probe positioning and electrical measurements through integrated hardware and intuitive software

Reliable Low-Noise Electrical Measurements

Acquire repeatable low-noise electrical measurements for accurate characterization of nanoscale materials and devices

Precision Fixture for Sample Loading

Simplify mounting of 3 mm half grids, FIB lift-out grids, and custom substrates with a dedicated sample loading fixture

Precision Movable Electrical Probe for Site-Specific Characterization

Position a movable electrical probe using precise uncoupled X, Y, and Z motion for site-specific electrical characterization

Stable Electrical Contacts for High-Resolution Imaging

Preserve imaging stability while performing localized electrical measurements and analytical TEM characterization

How it works

The TEM Biasing Nano-Manipulator Sample Holder combines a precision movable electrical probe, independent three-axis nanomanipulation, low-noise electrical connections, and an integrated source meter into a single platform for site-specific electrical characterization inside the TEM. Samples prepared on standard 3 mm half grids, FIB lift-out grids, or custom substrates are mounted in the removable sample cartridge using a dedicated setup block for accurate, repeatable assembly. The cartridge is then installed in the holder, automatically establishing electrical connections while leaving the measurement circuit open.

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During the experiment, the movable probe is positioned using uncoupled piezo-driven coarse and fine motion along the X, Y, and Z axes until it contacts the specimen, completing the electrical circuit under direct TEM observation. Hummingbird Control™ Software provides an intuitive graphical user interface for precise probe control with configurable step sizes and integrated motion compensation to simplify contact formation and optimize probe positioning.

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Once contact is established, researchers can apply electrical bias and acquire low-noise electrical measurements while simultaneously performing TEM/STEM imaging, electron diffraction, EDS, and EELS. The probe can be repositioned throughout the experiment to investigate multiple devices, interfaces, and regions within the same specimen, enabling flexible, site-specific electrical characterization in a single TEM session.