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TEM Air-Free Transfer Sample Holder

Operando heating, biasing under environmental conditions

Technical Specs
1580 Series Biasing Transfer
3 mm Grid Transfer
High Vacuum Transfer
Yes
Yes
Inert Gas Transfer
Yes
Yes
Sample Substrate
MEMS chips
3 mm TEM grid
Number of Electrical Contacts
9
0
Contact Type
Direct chip contact
N/A
Settled Resolution
Up to TEM resolution
Up to TEM resolution
High Temperature On-Chip Sample Heating
Yes
Yes
EELS/EDS Compatible
Yes
Yes
Instrument Type
TEM
TEM

Available For:

Protect air-sensitive and reactive materials during transfer to the TEM with dedicated holders for conventional TEM/STEM imaging of 3 mm grids or in-situ MEMS chips for heating and electrical biasing experiments

Key Features and Capabilities

Integrated Heating (Chip Sample Substrate Variant)

Optional add on
Perform variable-temperature in-situ experiments on air-sensitive materials with integrated MEMS heating to >1000 °C

60+ In-Stock TEM Heating and Biasing Chip Configurations (Chip Sample Substrate Variant)

Keep experiments moving with in-stock MEMS chips for heating, electrical biasing, and advanced in-situ TEM characterization

Nine Low-Noise Electrical Contacts (MEMS Variant)

Perform low-noise in-situ electrical measurements using up to nine direct chip electrical contacts with individually shielded coaxial connections

Choose Between 3 mm Grid and MEMS Chip Holder Variants

Dedicated holder variants support 3 mm TEM grids for routine characterization or MEMS chips for advanced in-situ heating and electrical biasing experiments

Vacuum or Inert-Gas Transfer for Air-Sensitive TEM Specimens

Protect air-sensitive specimens during glovebox-to-TEM transfer using sealed high-vacuum or inert-gas environments

How it works

The TEM Air-Free Transfer Sample Holder integrates a sealed transfer mechanism with dedicated holder platforms for conventional 3 mm TEM grids or MEMS heating and electrical biasing chips. Samples are prepared inside an inert atmosphere glovebox before being mounted onto the appropriate substrate and loaded into the holder. The transfer tip is then sealed under either high vacuum or an inert gas atmosphere for transfer to the TEM.

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Once loaded, the holder seals the specimen under either high vacuum or an inert gas atmosphere, allowing it to be transferred to the TEM without exposure to oxygen or moisture. After the holder is inserted into the microscope, the sealed transfer tip is opened inside the TEM vacuum, preserving the specimen's pristine native state until characterization begins.

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The 3 mm grid holder supports conventional TEM/STEM imaging and compatible analytical techniques, while the MEMS holder enables controlled in-situ heating up to above 1000 °C and electrical biasing experiments on preserved specimens. Together, these dedicated holder platforms allow researchers to investigate highly reactive materials without compromising their initial state prior to imaging or controlled stimulation.