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NEI Two-Channel STEM EBIC System

Operando heating, biasing under environmental conditions

Technical Specs
1555 series Single-tilt
1555 series Double-tilt
Imaging method
TEM, STEM, EBIC, SEEBIC
2 on holder
EBIC biasing channels
2 on holder
TEM, STEM, EBIC, SEEBIC
Sample substrates
FIB Lift-out chips, patterned heating and biasing substrates, wet-transfer substrates
FIB Lift-out chips, patterned heating and biasing substrates, wet-transfer substrates
Tilt Range
Up to ± 45° depending on objective pole
Up to ± 15° (alpha and beta) depending on objective pole
Beta-tilt accuracy
N/A
<0.01 degree
Biasing Contacts
9 contacts
Up to 9 contacts
Contact Type
Direct Chip Contact
Direct Chip Contact
Heating Temperature
>1000 °C
>1000 °C
Temperature Stability
100+ hours
100+ hours
Temperature Measurement
4-point resistance sensing
4-point resistance sensing
EELS / EDS Compatible
Yes
Yes
Instrument Type
TEM
TEM

Available For:

Measure electronic properties using two independent Electron Beam-Induced Current (EBIC) channels while correlating electronic, structural, and chemical information from the same nanoscale region during TEM/STEM analysis.

Key Features and Capabilities

60+ In-Stock TEM Heating and Biasing Chip Configurations

Keep experiments moving with in-stock MEMS chips for in-situ TEM heating, electrical biasing, and STEM EBIC

High-Accuracy and Repeatable Double Tilt

Optimize sample orientation for diffraction, crystallography, and analytical TEM workflows using the double-tilt holder configuration

Integrated Heating

Optional add on
Study temperature-dependent electronic behavior while maintaining correlative TEM/STEM characterization

Correlative EBIC, SEEBIC, TEM/STEM, EDS, and EELS

Relate electronic properties directly to crystal structure and chemical composition during a single experiment

Screw-Free Direct Chip Insertion

Load MEMS chips quickly with reliable electrical contact and simplified experiment setup

Two-Channel Electron Beam-Induced Current Measurement

Acquire independent Electron Beam-Induced Current (EBIC) and Secondary Electron Electron Beam-Induced Current (SEEBIC) signals for correlative electronic characterization

How it works

The NEI Two-Channel STEM EBIC System combines a Hummingbird Scientific TEM sample holder with NanoElectronic Imaging (NEI) low-noise Electron Beam-Induced Current (EBIC) electronics, compatible sample substrates, and signal conditioning hardware into a correlative electronic characterization workflow.

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An electrically contacted sample is mounted on an EBIC-compatible substrate and inserted into the TEM for STEM imaging. As the focused electron probe scans the sample, beam-sample interactions generate Electron Beam-Induced Current (EBIC) and Secondary Electron Electron Beam-Induced Current (SEEBIC) signals. Two independent, low-noise current measurement channels acquire and synchronize these signals with probe position to generate spatially resolved current maps.

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Correlate conductivity, charge transport, electric fields, polarization, and current pathways with TEM/STEM imaging, Energy-Dispersive X-ray Spectroscopy (EDS), and Electron Energy Loss Spectroscopy (EELS) from the same nanoscale region. Optional heating and double-tilt capabilities extend the workflow to temperature-dependent studies and precise crystal orientation for advanced electronic materials research.