TEM MEMS Heating + Biasing technical specs Brochure

Heat and electrically bias samples inside your TEM with >1000 °C closed-loop MEMS heating, 9 electrical contacts, and screw-free direct chip loading. *Double-tilt option also available.

Technical Specs

1550 Series Single-Tilt

1550 Series Double-Tilt

Tilt Range

Up to ± 45° depending on objective pole

<0.01 degree

Beta Tilt Accuracy

N/A

Up to ±30° α and ±20° β depending on objective pole

Electrical Contacts

9 contacts

Contact Type

Direct chip contact

Max Operating Temperature

>1000 °C

Settled Resolution at 1000°C

Up to TEM resolution

Temperature Stability

100+ hours

Temperature Measurement

4-point resistive sensing

Special Cabling & Biasing Options

High-voltage or high-frequency biasing options

EELS / EDS Compatible

Yes

Available For:

www.hummingbirdscientific.com ©Hummingbird Scientific 2026 -The specifications provided are subject to change without notice.

Key Features and Capabilities

Screw-Free Direct Chip Insertion

Load MEMS chips quickly with reliable electrical contact and simplified experiment setup

Nine Low-Noise Electrical Contacts

Perform low-noise in-situ electrical measurements with nine direct chip electrical contacts and individually shielded coaxial cables

Closed-Loop MEMS Heating Above 1000 °C

Achieve stable high-temperature experiments with rapid MEMS heating and precise temperature control alongside concurrent biasing

High-Accuracy and Repeatable Double Tilt

Optimize sample orientation for atomic resolution, zone axis orientation, diffraction, crystallography, and analytical TEM workflows using the double-tilt holder configuration

Multimodal Characterization

Correlate heating, electrical biasing, and imaging data across TEM, SEM, and X-ray microscopy platforms

High-Voltage Biasing

Optional add on

Extend electrical characterization capabilities with specialized biasing hardware and chip configurations for up to 1 kV electrical biasing

www.hummingbirdscientific.com ©Hummingbird Scientific 2026 -The specifications provided are subject to change without notice.

Built for Diverse Applications

Magnetic polarization of nanocrystals within bacterial cells

Bio/Soft Materials

Visualize biological and soft matter systems dynamics, including growth, interactions, and degradation.

Biomineralization

Self-Assembly Processes

Metal-Organic Framework Dynamics

Soft Matter Dynamics

Biomolecular Interactions

Semiconductors

Investigate device operation, degradation, and failure in semiconductor materials.

Operando Device Switching

Electromigration Studies

Defect Evolution

Thermal Reliability Testing

Failure Analysis

Quantum Materials

Investigate phase transitions, defect dynamics, and electronic properties in quantum materials.

Phase Transitions

Electronic Properties

Defect Dynamics

Quantum Heterostructures

Domain Evolution

Featured Research

Heating-rate-dependence of phase transformations in atomically thin MoS₂ observed by in-situ STEM

Annealing of 2D MoS₂ at different heating rates shows different phase transformations from MoS₂ to either a highly ordered crystalline island structure that is composed of both 2H and 3R phases (a-c) or to nanocrystalline and amorphous regions (a,d-e).

Reference: Pawan Kumar, et al. npj 2D Materials and Applications (2020).DOI: 10.1038/s41699-020-0150-2

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www.hummingbirdscientific.com ©Hummingbird Scientific 2026 -The specifications provided are subject to change without notice.

Selected Publications

Cheng-Yu Chen, Duncan Burns, Peter W. Voorhees, Eric A. Stach. “Interfacial Energy Gradients Drive Coalescence of Supported Nanoparticles”. ACS Nano (2025)

DOI:

10.1021/acsnano.5c13727

Lee Daniels, Khai-Nghi Truong, Robert Bücker, Christian Göb, Christian Schürmann, Jakub Wojciechowski, Mathias Meyer. “Challenges and Victories: Variable Temperature MicroED on Small Molecules”. Structural Dynamics (2025)

DOI:

10.1063/4.0000541

Leifeng Zhang, Christophe Gatel, Muhammad Hamid Raza, Kilian Gruel, Catherine Dubourdieu, Martin Hÿtch. “Mapping electric fields and observation of ferroelectric domain switching in hafnia-zirconia devices by electron holography”. Nature Communications (2025)

DOI:

10.1038/s41467-025-66807-4

Gaurav Modi, Shubham K. Parate, Choah Kwon, Andrew C. Meng, Utkarsh Khandelwal, Anudeep Tullibilli, James Horwath, Peter K. Davies, Eric A. Stach, Ju Li, Pavan Nukala, Ritesh Agarwal. “Electrically driven long-range solid-state amorphization in ferroic In2Se3”. Nature (2024)

DOI:

10.1038/s41586-024-08156-8

Gaurav Modi, Andrew C. Meng, Srinivasan Rajagopalan, Rangarajan Thiruvengadam, Peter K. Davies, Eric A. Stach, Ritesh Agarwal. “Controlled Self-Assembly of Nanoscale Superstructures in Phase-Change Ge-Sb-Te Nanowires”. Nano Letters (2024)

DOI:

10.1021/acs.nanolett.4c00878