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TEM Cryo Biasing + Heating Sample Holder

Operando heating, biasing under environmental conditions

Technical Specs
1950 Series
Sample Temperature Range
~-170 °C to > 1000 °C
Temperature Control
Yes
Dewar Lifetime to Refill
4 hours
Number of Electrical Contacts
9
Contact Type
Direct Chip Contact
Settled Resolution at Minimum Temperature
Up to TEM resolution
EELS / EDS Compatible
Yes
Instrument Type
TEM

Available For:

Correlate nanoscale structural, chemical, and electrical changes across cryogenic and elevated temperatures with simultaneous electrical biasing during in-situ TEM experiments

Key Features and Capabilities

Integrated Heating

Optional add on
Expand from cryogenic cooling to variable-temperature electrical biasing with integrated MEMS heating to > 1000 °C

Stable Imaging and Analytical Compatibility at Low Temperature

Maintain stable imaging with EDS and EELS compatibility throughout cryogenic in-situ TEM experiments

Screw-Free Direct Chip Insertion

Load MEMS chips quickly with reliable electrical contact and simplified experiment setup

Nine Low-Noise Electrical Contacts

Perform low-noise in-situ electrical measurements with nine direct chip electrical contacts and individually shielded coaxial cables

60+ In-Stock TEM Heating and Biasing Chip Configurations

Keep experiments moving with in-stock MEMS chips for heating, electrical biasing, and advanced in-situ TEM characterization

Cryogenic Cooling for Stable In-Situ Characterization

Perform stable electrical biasing experiments at cryogenic temperatures with precise temperature control

How it works

The TEM Cryo Biasing + Heating Sample Holder combines a liquid nitrogen cooling system, integrated electrical contacts, MEMS-based sample chips, and precision temperature control to create a stable platform for variable-temperature electrical biasing inside the TEM. Researchers mount samples directly onto a MEMS chip and load it using the direct chip insertion mechanism for fast, reproducible experiment setup.

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During operation, the liquid nitrogen Dewar cools the sample to ~−170 °C. A furnace heater and thermocouple sensor allow access to intermediate temperatures from ~−170 °C up to room temperature while MEMS-based heaters with an on-chip temperature sensor allow access to temperatures above 1000 °C. MEMS-based Heating + Biasing chips provide simultaneous thermal control and electrical biasing, allowing researchers to observe temperature-dependent structural, chemical, and electrical changes during real-time in-situ TEM imaging.

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Direct chip insertion with nine electrical contacts provides reliable electrical connections for biasing experiments while maintaining stable imaging and analytical access throughout the operating temperature range.