Cryo-Electrical Microscopy for Quantum and Advanced Energy Applications
Microscopy and Microanalysis
2021
Correlate nanoscale structural, chemical, and electrical changes across cryogenic and elevated temperatures with simultaneous electrical biasing during in-situ TEM experiments
Observe Cryogenic and High-Temperature Material Behavior Inside the TEM
The Hummingbird Scientific TEM Cryo Biasing + Heating Sample Holder enables in-situ TEM experiments with integrated electrical biasing and dual-temperature control accessing intermediate and elevated temperatures between ~−170 °C and >1000 °C. Simultaneously apply electrical stimuli and capture high-resolution structural, chemical, and electrical changes in real time, enabling reproducible characterization across an exceptionally wide temperature range.
Designed for Variable-Temperature Electrical Characterization
Designed for researchers investigating functional materials and electronic devices, the holder supports studies of quantum materials, semiconductor devices, battery materials, low-dimensional materials, thin films, and nanoscale electronic systems. Its broad operating temperature range enables experiments on phase transitions, electrical transport, defect evolution, thermal stability, and device performance under precisely controlled experimental conditions.
Correlate Cryogenic Electrical Performance with Structural Evolution
Many functional materials exhibit temperature-dependent behavior that cannot be fully understood using conventional characterization techniques. The Hummingbird Scientific TEM Cryo Biasing + Heating Sample Holder enables researchers to directly correlate structural, chemical, and electrical changes by combining cryogenic cooling, high-temperature heating, electrical biasing, and in-situ TEM imaging within a single experiment. This integrated workflow provides deeper insight into temperature-dependent mechanisms, material behavior, and device operation under realistic operating conditions.
Hummingbird Advantages:
- Enables variable-temperature in-situ TEM experiments from ~−170 °C to >1000 °C with precise closed-loop temperature control using a single sample holder.
- Reduce setup time and improve repeatability through industry-leading ease-of-use screw-free direct MEMS chip insertion.
- Correlate structural, chemical, and electrical changes using nine direct-chip electrical contacts for simultaneous biasing and electrical measurement.
- Preserve analytical performance with full EELS and EDS compatibility across the operating temperature range.
- Expand experimental possibilities with FIB lift-out chips, multiple electrode materials and geometries, and custom MEMS chip designs.
Technical Specs
1950 Series
Sample Temperature Range
~-170 °C to > 1000 °C
Temperature Control
Yes
Dewar Lifetime to Refill
4 hours
Number of Electrical Contacts
9
Contact Type
Direct Chip Contact
Settled Resolution at Minimum Temperature
Up to TEM resolution
EELS / EDS Compatible
Yes
Available For:
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How it Works
The TEM Cryo Biasing + Heating Sample Holder combines a liquid nitrogen cooling system, integrated electrical contacts, MEMS-based sample chips, and precision temperature control to create a stable platform for variable-temperature electrical biasing inside the TEM. Researchers mount samples directly onto a MEMS chip and load it using the direct chip insertion mechanism for fast, reproducible experiment setup.
During operation, the liquid nitrogen Dewar cools the sample to ~−170 °C. A furnace heater and thermocouple sensor allow access to intermediate temperatures from ~−170 °C up to room temperature while MEMS-based heaters with an on-chip temperature sensor allow access to temperatures above 1000 °C. MEMS-based Heating + Biasing chips provide simultaneous thermal control and electrical biasing, allowing researchers to observe temperature-dependent structural, chemical, and electrical changes during real-time in-situ TEM imaging.
Direct chip insertion with nine electrical contacts provides reliable electrical connections for biasing experiments while maintaining stable imaging and analytical access throughout the operating temperature range.
Key Features and Capabilities
Cryogenic Cooling for Stable In-Situ Characterization
Perform stable electrical biasing experiments at cryogenic temperatures with precise temperature control
Screw-Free Direct Chip Insertion
Load MEMS chips quickly with reliable electrical contact and simplified experiment setup
Nine Low-Noise Electrical Contacts
Perform low-noise in-situ electrical measurements with nine direct chip electrical contacts and individually shielded coaxial cables
60+ In-Stock TEM Heating and Biasing Chip Configurations
Keep experiments moving with in-stock MEMS chips for heating, electrical biasing, and advanced in-situ TEM characterization
Stable Imaging and Analytical Compatibility at Low Temperature
Maintain stable imaging with EDS and EELS compatibility throughout cryogenic in-situ TEM experiments
Optional add-on feature
Integrated Heating
Expand from cryogenic cooling to variable-temperature electrical biasing with integrated MEMS heating to > 1000 °C
Built for Diverse Research Applications
Featured Research
a) Multi-scale schematic showing cryo biasing holder tip, FIB chip, and mounted nanowire sample. b) LN2 cooling and dual heating function to access intermediate temperatures between-170 °C and room temperature. c) Current response at cryogenic temperature following the plating of a dendrite layer on the surface of the nanowire.
In-situ biasing of a nanowire at cryogenic temperature during dendrite plating reaction
Electrical biasing was performed at -170 °C on a nanowire sample bridging the electrodes on the biasing chip. Pre-patterned metal leads connect to electron transparent membranes or holes in the substrate to electrically bias the sample. The chronopotentiometric characteristic of the nanowire device shows that with constant pA-range current applied and measured at cold temperatures, the voltage drops across the nanowire as a reaction proceeds with the plating of a dendrite layer on the surface.
Reference: Internal Collaboration withUCSD/Battery500 Consortium
Software
Spend less time managing equipment and more time generating results. Hummingbird Control™ Software provides intuitive control of cooling, heating, and biasing functions, including temperature set points, closed-loop heating behavior, and voltage sweep workflows when configured with the system.
Hummingbird Connect™ can support the broader software strategy by connecting holder operation, microscope context, imaging workflows, and experiment metadata. Together, these software tools help improve reproducibility, experiment setup, data organization, and long-term usability for in-situ TEM heating and biasing experiments.
Built on Engineering Excellence
Hummingbird Scientific designs, machines, assembles, tests, and services its products in-house. Our integrated engineering, precision manufacturing, microfabrication, software development, applications, and service teams enable rapid prototyping and iteration, custom modifications, and direct technical support throughout the life of the instrument.
The TEM Cryo Biasing + Heating Sample Holder reflects this engineering approach by integrating cryogenic cooling, high-temperature heating, electrical biasing, and precision temperature control into a unified platform for reproducible variable-temperature in-situ TEM experiments. The holder, MEMS chip interface, controller, and software are engineered together to deliver stable performance from <−170 °C to >1000 °C.
Need something unique? Our engineers can customize holder configurations, MEMS chip designs, electrical interfaces, temperature-control workflows, and sample geometries to support specialized cryogenic and variable-temperature TEM experiments.
Frequently Asked Questions
What is the TEM Cryo Biasing + Heating Sample Holder?
What types of experiments can be performed with the TEM Cryo Biasing + Heating Sample Holder?
What are the advantages of a wide operating temperature range of the TEM Cryo Biasing + Heating Sample Holder for in-situ TEM?
How many electrical contacts does the TEM Cryo Biasing + Heating Sample Holder provide?
How easy is it to set up and run in-situ TEM experiments using the TEM Cryo Biasing + Heating Sample Holder?
Can EDS and EELS be performed during cryogenic cooling, heating, and electrical biasing?
What advantages does the TEM Cryo Biasing + Heating Sample Holder's MEMS chip platform provide?
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TEM Cryo Biasing + Heating
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