
Available For:




The TEM Tomography Sample Holder integrates interchangeable removable sample tips into a flexible platform for high angle single-tilt electron tomography, conventional TEM/STEM imaging, and correlative atom probe tomography (APT). Samples are mounted onto the removable tip best suited to the specimen geometry before the tip is inserted into the holder for imaging and tomography experiments.
A range of removable tip configurations supports 3 mm and 1 mm grids, FIB lift-out specimens, APT needle specimens, microfabricated chips, and custom sample geometries. Each tip is designed to maximize accessible tilt while minimizing sample shadowing, helping researchers obtain higher-quality three-dimensional tomographic reconstructions.
While specifically engineered for automated tilt-series acquisition and tomographic reconstruction workflows, the holder is also widely used as a general-purpose single-tilt holder thanks to its exceptional stability, ease of use, and compatibility with a wide range of sample substrates. The removable tips allow the same specimen to be transferred between TEM tomography and atom probe tomograpy (APT) mounting systems, enabling direct correlative three-dimensional characterization.