See Hummingbird products at work in published in situ research

Explore published research enabled by Hummingbird Scientific holders, chips, and systems across in situ and operando TEM, SEM, and X-ray workflows. Browse experimental approaches and system configurations across a wide range of samples and environments to find examples relevant to your own microscope, measurement goals, and experimental planning.

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Atom Probe Tomography of Electronic Materials

Thomas F. Kelly, David J. Larson, Keith Thompson, Roger L. Alvis, Joseph H. Bunton, Jesse D. Olson, Brian P. Gorman

Annual Review of Materials Research

2007

Thomas F. Kelly, David J. Larson, Keith Thompson, Roger L. Alvis, Joseph H. Bunton, Jesse D. Olson, Brian P. Gorman. “Atom Probe Tomography of Electronic Materials”. Annual Review of Materials Research (2007)

Abstract
Use of Focused Ion Beam Milling for Preparation of Frozen-Hydrated Specimens for TEM Tomography

M Marko, M Scheeff, N Salmon, C Hsieh, M Rodriguez, J Frank, C Mannella

Microscopy and Microanalysis

2007

M Marko, M Scheeff, N Salmon, C Hsieh, M Rodriguez, J Frank, C Mannella. “Use of Focused Ion Beam Milling for Preparation of Frozen-Hydrated Specimens for TEM Tomography”. Microscopy and Microanalysis (2007)

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