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Perform in-situ liquid-phase TEM with controlled microfluidic flow, integrated MEMS heating and biasing, and optional dual-inlet reagent mixing for dynamic materials characterization.

Study dynamic processes in controlled liquid environments with in-situ liquid-phase SEM. Supports static or continuous flow, optional reagent mixing, and MEMS chips for heating, electrical biasing, and electrochemistry.

Capture dynamic liquid-phase nanoscale processes with in-situ X-ray microscopy and spectroscopy. Supports static or continuous liquid flow, optional dual-inlet mixing, and MEMS heating, electrical biasing, and electrochemistry.

Study dynamic gas–solid reactions with in-situ gas-phase TEM using closed-loop MEMS heating beyond 1000 °C, gas flow up to 2 bar, and optional multi-channel delivery with mixing of up to eight gases.

Perform in-situ SEM gas heating experiments with >1000 °C closed-loop MEMS heating and gas flow up to 2 bar.

Study gas–solid reactions during in-situ X-ray experiments with >1000 °C MEMS heating and gas flow up to 2 bar.

Heat and electrically bias samples inside your TEM with >1000 °C closed-loop MEMS heating, 9 electrical contacts, and screw-free direct chip loading. *Double-tilt option also available.

Perform in-situ SEM heating and electrical biasing above 1000 °C with screw-free direct MEMS chip loading, 9 electrical contacts, and closed-loop temperature control.

Correlate structural, chemical, and electrical changes during in-situ synchrotron X-ray experiments with >1000 °C closed-loop MEMS heating and electrical biasing with 9-electrical contacts.

Bring the precision and control of benchtop electrochemistry to your in-situ liquid-phase TEM experiments with bulk off-chip electrodes, optional dual-inlet mixing and integrated MEMS heating.

Perform in-situ synchrotron X-ray microscopy with bulk liquid electrochemistry using off-chip reference and counter electrodes for stable, reproducible measurements.

Perform liquid-phase electrochemistry inside your SEM with electrochemical performance that closely matches conventional bulk benchtop measurements.

Perform site-specific electrical probing, nanomanipulation, and in-situ biasing inside the TEM using a movable probe with concurrent structural and chemical characterization.

Apply controlled in-plane magnetic fields up to 900 Gauss during in-situ TEM, Lorentz TEM, and electron holography with passive beam deflection compensation for stable imaging.

Transfer air-sensitive samples to the TEM under vacuum or inert gas using dedicated sample holders for 3 mm grids or MEMS heating and/or biasing chips.

Correlate Electron Beam-Induced Current (EBIC), TEM/STEM imaging, EDS, and EELS to characterize electronic properties of semiconductor devices, functional materials, and nanoelectronic systems.

Perform TEM tomography, conventional TEM/STEM imaging, and correlative atom probe tomography using interchangeable removable tips for diverse specimen geometries and experimental workflows.

Perform in-situ TEM bulk liquid electrochemistry with integrated optical illumination to study light-stimulated electrochemical and material transformations.

Perform operando plasma TEM experiments with controlled gas environments, in-situ plasma generation, MEMS heating beyond 1000 °C, and atomic-resolution imaging.

Recreate realistic industrial reaction environments inside the TEM with gas pressures up to 20 bar, controlled gas flow, and closed-loop MEMS heating above 1000 °C.

Perform variable-temperature in-situ TEM with closed-loop temperature control from <−170 °C to >1000 °C, screw-free direct MEMS chip loading, and 9 electrical contacts for on-chip heating and electrical biasing.

Perform in-situ TEM electrical biasing experiments with 8 electrical contacts, flexible chip carriers, and support for Hummingbird Scientific chips as well as your own custom-fabricated devices.

Perform in-situ TEM gas-phase experiments with integrated optical illumination, closed-loop MEMS heating beyond 1000 °C, and controlled gas flow to investigate light-stimulated gas–solid reactions.

Study catalysts and functional materials under industry-relevant high-pressure gas environments inside the SEM with controlled gas flow, pressures up to 20 bar, and temperatures beyond 1000 °C.

Perform in-situ X-ray characterization of catalysts and functional materials under industry-relevant high-pressure gas environments with pressures up to 20 bar and temperatures beyond 1000 °C.