Peer-reviewed programs have helped shape specialized holders, chips, controllers, and workflows for demanding microscopy applications.
Hummingbird Scientific is not only a manufacturer of in situ microscopy products. For more than two decades, our engineering team has advanced new microscopy capabilities through grant-funded research, custom instrument development, and product commercialization. This research record reflects sustained work in controlled sample environments, microfabricated chips, specimen holders, stimulus control, correlative workflows, cryo-EM preparation, and data-aware microscopy systems.
Supported by agencies such as NIH, DOE, DoD, and NIST, these programs help turn hard microscopy problems into practical platforms for researchers working inside TEM, SEM, X-ray, and cryo-EM instruments.

Research that becomes instrumentation
Many Hummingbird Scientific products began as applied engineering research: a new way to hold a sample, control an environment, deliver a stimulus, protect a microscope, capture experimental metadata, or connect measurements across instruments. The archive on this page highlights the research programs behind those developments and shows how technical challenges in microscopy become working holders, chips, controllers, workflows, and instrument platforms.
A different kind of in situ microscopy company
Hummingbird Scientific’s research history reflects a company built around instrument development, not catalog sales alone. The same team that designs products also investigates new workflows, builds prototypes, evaluates performance, and brings specialized systems into use for demanding microscopy experiments. That closed loop gives customers and collaborators access to technical depth that is difficult to reproduce with standard products alone.
Development across microscopy platforms
Hummingbird Scientific’s grant-funded work spans many of the technologies used in modern in situ and operando microscopy, including gas, liquid, heating, electrical biasing, electrochemistry, cryogenic workflows, tomography, magnetizing, optical-access, X-ray, SEM, TEM, custom chips, controllers, and automation.
Together, these projects show the breadth of Hummingbird’s technical history and the company’s role in turning specialized research requirements into practical microscopy instrumentation.

Bring us your most difficult in situ microscopy challenge
Hummingbird Scientific can help translate specialized experimental requirements into holders, chips, controllers, workflows, or custom instrumentation built around your application.

Grant Archive
The projects below are a featured archive of research and development grants awarded to Hummingbird Scientific for advancing in situ microscopy instrumentation. They represent selected funded programs that contributed to Hummingbird holders, chips, controllers, workflows, and platform technologies.
TEM Sample Holder for Real-Time Observation of Non-Thermal Plasma Electrochemistry
Enables nanoscale observation of plasma-driven electrochemical reactions while they occur inside the microscope.
Multiport High-Pressure Synchrotron X-Ray Microscopy Cell
Supports controlled high-pressure experiments with multiple fluid or gas connections during synchrotron imaging.
Development of an In Situ High-Voltage Biasing Holder for the Transmission Electron Microscope
Provides stable high-voltage electrical stimulation while materials are imaged at high spatial resolution.
Development of an Instant-Freezing Sample-Preparation System for Cryo-EM
Aims to vitrify biological samples rapidly enough to capture short-lived molecular states.
Continuous-Rotation TEM Tomography Stage for Imaging, Spectroscopy, and In Situ Materials Characterization
Combines uninterrupted specimen rotation with analytical measurements for more complete three-dimensional characterization.
Multiport High-Pressure Synchrotron X-Ray Microscopy Cell
Supports controlled high-pressure experiments with multiple fluid or gas connections during synchrotron imaging.
High-Precision Piezo-Driven Replacement Goniometer for Cryo-Electron Microscopy
Improves specimen positioning accuracy and repeatability for automated cryogenic microscopy workflows.
Development and Commercialization of a Sample-Preparation System for Time-Resolved Cryo-Electron Microscopy
Prepares vitrified specimens at defined time points to reveal transient biological processes.
Ultra-Low Liquid-Helium-Temperature In Situ TEM Sample Holder
Maintains specimens near liquid-helium temperatures while preserving access for microscopy experiments.
Ultra-Low-Temperature Liquid-Helium In Situ (S)TEM Stage
Integrates deeply cryogenic temperature control with precise specimen motion inside the column.
Multiport High-Pressure Synchrotron X-Ray Microscopy Cell
Supports controlled high-pressure experiments with multiple fluid or gas connections during synchrotron imaging.
Streptavidin Affinity Grids for Preparing Biological Samples for Cryogenic Electron Microscopy
Uses affinity capture to concentrate and orient target biomolecules directly on cryogenic microscopy grids.
Ultra-Stable and Repeatable TEM Stage for Improved Biomolecular Structure Characterization
Reduces positioning error and drift to improve the consistency of high-resolution biomolecular data collection.
Cryo-Correlative Light and Electron Microscopy Transfer Holder for High-Resolution Imaging
Preserves cryogenic samples during transfer between light and electron microscopes for coordinated imaging.
Development and Commercialization of a Sample-Preparation System for Time-Resolved Cryo-Electron Microscopy
Prepares vitrified specimens at defined time points to reveal transient biological processes.
Ultra-Low Liquid-Helium-Temperature In Situ TEM Sample Holder
Maintains specimens near liquid-helium temperatures while preserving access for microscopy experiments.
Ultra-Low-Temperature Liquid-Helium In Situ (S)TEM Stage
Integrates deeply cryogenic temperature control with precise specimen motion inside the column.
Continuous-Rotation TEM Tomography Stage for Imaging, Spectroscopy, and In Situ Materials Characterization
Combines uninterrupted specimen rotation with analytical measurements for more complete three-dimensional characterization.
Cryogenic Temperature-Controlled Electrical-Biasing In Situ TEM Sample Platform
Combines low-temperature control with electrical measurements to study functional materials under operating conditions.
In Situ TEM Characterization of Electrochemical Processes in Solid-State Energy-Storage Devices with Air-Sensitive Materials
Allows air-sensitive battery materials to be transferred, biased, and observed during electrochemical activity.
High-Stability Solid-State-Cooled Cryo-TEM Transfer Holder
Uses solid-state cooling to maintain cryogenic samples with improved mechanical stability during transfer and imaging.
Cryogenic Temperature-Controlled Electrical-Biasing In Situ TEM Sample Platform
Combines low-temperature control with electrical measurements to study functional materials under operating conditions.
In Situ TEM Characterization of Electrochemical Processes in Solid-State Energy-Storage Devices with Air-Sensitive Materials
Allows air-sensitive battery materials to be transferred, biased, and observed during electrochemical activity.
In Situ Correlative Electron, X-Ray, and Optical Environmental Cell for Electrochemical Imaging and Spectroscopy
Keeps experimental conditions consistent while the same electrochemical sample is examined with complementary imaging methods.
In Situ Correlative Electron, X-Ray, and Optical Environmental Cell for Electrochemical Imaging and Spectroscopy
Keeps experimental conditions consistent while the same electrochemical sample is examined with complementary imaging methods.
TEM Holder System for Monitoring and Controlling Liquid-Cell Conditions with Integrated pH and Temperature Sensors
Measures local solution conditions during liquid-cell experiments so results can be interpreted quantitatively.
In Situ Environmental Fluid-Cell Electrical Biasing and Heating Platform for Synchrotron X-Ray Microscopy
Applies electrical and thermal stimuli to fluid-cell specimens during synchrotron measurements.
TEM Holder System for Monitoring and Controlling Liquid-Cell Conditions with Integrated pH and Temperature Sensors
Measures local solution conditions during liquid-cell experiments so results can be interpreted quantitatively.
In Situ Environmental Fluid-Cell Electrical Biasing and Heating Platform for Synchrotron X-Ray Microscopy
Applies electrical and thermal stimuli to fluid-cell specimens during synchrotron measurements.
Cross-Correlative Double-Tilt Nanomechanical Testing Platform for the TEM and SEM
Performs controlled mechanical testing while allowing the specimen to be examined across electron-microscopy platforms.
Liquid and Full-Pressure-Range Gas Environmental TEM Specimen Holders for High-Resolution Elemental Analysis
Extends environmental microscopy across liquid and gas conditions while retaining access to analytical signals.
Integrated Cross-Correlative Environmental Specimen Holder Platform for Optical, Scanning, and Transmission Electron Microscopes
Maintains a common specimen environment for sequential measurements across optical, scanning, and transmission instruments.
Cross-Correlative Double-Tilt Nanomechanical Testing Platform for the TEM and SEM
Performs controlled mechanical testing while allowing the specimen to be examined across electron-microscopy platforms.
Liquid and Full-Pressure-Range Gas Environmental TEM Specimen Holders for High-Resolution Elemental Analysis
Extends environmental microscopy across liquid and gas conditions while retaining access to analytical signals.
Ultra-Low-Drift Transmission Electron Microscopy In Situ Heating Holder
Minimizes specimen movement during heating so structural changes can be followed at high resolution.
Full-Pressure-Range Environmental Gas-Heating Holder for Operando TEM Gas-Reaction Experiments
Controls gas pressure and temperature to reveal catalyst behavior under realistic reaction conditions.
Integrated Cross-Correlative Environmental Specimen Holder Platform for Optical, Scanning, and Transmission Electron Microscopes
Maintains a common specimen environment for sequential measurements across optical, scanning, and transmission instruments.
Improved Frozen-Sample Preparation for Cryogenic Electron Microscopy
Refines freezing and handling methods to produce more consistent vitrified specimens for structural analysis.
In Situ TEM Microfluidic Specimen Holder with High-Accuracy Environmental Monitoring and Control
Delivers and regulates small fluid volumes while tracking the conditions surrounding the specimen.
Full-Pressure-Range Environmental Gas-Heating Holder for Operando TEM Gas-Reaction Experiments
Controls gas pressure and temperature to reveal catalyst behavior under realistic reaction conditions.
Phase-Plate Holder for Transmission Electron Microscopy
Positions and stabilizes phase-modifying elements to enhance contrast in weakly scattering specimens.
Nanoscale Imaging of Solid-State Energy Conversion Processes at the Solid–Liquid Interface Using Real-Time TEM
Reveals dynamic reactions where solid energy materials interact with liquids during operation.
Atomic Force Microscopy In Situ in the TEM
Combines force and surface measurements with simultaneous electron imaging at the nanoscale.
Ultra-Low-Drift Transmission Electron Microscopy In Situ Heating Holder
Minimizes specimen movement during heating so structural changes can be followed at high resolution.
Continuous-Flow Liquid Cell Holder for the Transmission Electron Microscope and STEM
Circulates fresh liquid through the observation region for controlled, repeatable experiments.
Observing Biological and Chemical Interactions at Nanoscale Resolution with Scanning Transmission Electron Microscopy
Makes dynamic biological and chemical interactions accessible to nanoscale imaging under controlled conditions.
Integrated Environmental Holder for the TEM
Creates a controlled local environment around the specimen for experiments beyond conventional vacuum imaging.
High-Applied-Field Magnetizing Cryogenic In Situ Transmission Electron Microscopy Platform
Applies strong magnetic fields at low temperature to study field-dependent material behavior.
Improved Frozen-Sample Preparation for Cryogenic Electron Microscopy
Refines freezing and handling methods to produce more consistent vitrified specimens for structural analysis.
Phase-Plate Holder for Transmission Electron Microscopy
Positions and stabilizes phase-modifying elements to enhance contrast in weakly scattering specimens.
Continuous-Flow Liquid Cell Holder for the Transmission Electron Microscope
Maintains a controlled liquid flow across the imaging region during electron-microscopy observations.
Instrumentation for Quantifiable Experimental Mechanics at the Deep Nanoscale
Measures applied forces and specimen response directly to make nanoscale mechanical testing more quantitative.
Continuous-Flow Liquid Cell Holder for the Transmission Electron Microscope and STEM
Circulates fresh liquid through the observation region for controlled, repeatable experiments.
System for Generation of Frozen-Hydrated Samples Using the FIB
Uses focused-ion-beam processing to create electron-transparent frozen specimens from hydrated material.
Ultrahigh-Resolution Specimen Holder with Large Tilt Range for the Transmission Electron Microscope
Expands angular access while maintaining the stability needed for high-resolution imaging.
High-Accuracy Full-Rotation Sample Manipulator for Electron Tomography
Provides precise full-angle specimen rotation to reduce missing information in three-dimensional reconstructions.
System for Generation of Frozen-Hydrated Samples Using the FIB
Uses focused-ion-beam processing to create electron-transparent frozen specimens from hydrated material.
Ultra-High-Temperature Stage for the TEM
Enables controlled heating to extreme temperatures while specimens remain available for direct observation.
High-Accuracy Full-Rotation Sample Manipulator for Electron Tomography
Provides precise full-angle specimen rotation to reduce missing information in three-dimensional reconstructions.
Ultrahigh-Resolution Specimen Holder with Large Tilt Range for the Transmission Electron Microscope
Expands angular access while maintaining the stability needed for high-resolution imaging.