See Hummingbird products at work in published in situ research

Explore published research enabled by Hummingbird Scientific holders, chips, and systems across in situ and operando TEM, SEM, and X-ray workflows. Browse experimental approaches and system configurations across a wide range of samples and environments to find examples relevant to your own microscope, measurement goals, and experimental planning.

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Fracture Testing of Nanoscale Thin Films Inside the Transmission Electron Microscope

Sandeep Kumar, M.A. Haque

International Journal of Applied Mechanics

2010

Sandeep Kumar, M.A. Haque. “Fracture Testing of Nanoscale Thin Films Inside the Transmission Electron Microscope”. International Journal of Applied Mechanics (2010)

Abstract
In situ transmission electron microscopy and spectroscopy studies of interfaces in Li ion batteries: Challenges and opportunities

C.M. Wang,  W. Xu; J. Liu, D.W. Choi, B. Arey, L.V. Saraf, J.G. Zhang, Z.G. Yang, S. Thevuthasan, D.R. Baer, N. Salmon

Journal of  Materials Research

2010

C.M. Wang, W. Xu, J. Liu, D.W. Choi, B. Arey, L.V. Saraf, J.G. Zhang, Z.G. Yang, S. Thevuthasan, D.R. Baer, N. Salmon. “In situ transmission electron microscopy  and spectroscopy studies of interfaces in Li ion batteries: Challenges and  opportunities”.  Journal of Materials Research (2010)

Abstract
Length-scale effects on fracture of multilayers

S Kumar, D Zhuo, D E Wolfe, J A Eades, M A Haque

Scripta Materialia

2010

S Kumar, D Zhuo, D E Wolfe, J A Eades, M A Haque. “Length-scale effects on fracture of multilayers”. Scripta Materialia (2010)

Abstract
Recent Progress in Lorentz Transmission Electron Microscopy

Marc De Graef

8th European Symposium on Martensitic Transformations

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2009

Marc De Graef. “Recent Progress in Lorentz Transmission Electron Microscopy”. 8th European Symposium on Martensitic Transformations (2009)

Abstract
Liquid and Three-Dimensional Scanning Transmission Electron Microscopy for Biological Specimen

N de Jonge, MJ Dukes, GJ Kremers, BM Northan, DB Peckys, EA Ring, DW Piston, R Sougrat

Microscopy and Microanalysis

2009

N de Jonge, MJ Dukes, GJ Kremers, BM Northan, DB Peckys, EA Ring, DW Piston, R Sougrat. “Liquid and Three-Dimensional Scanning Transmission Electron Microscopy for Biological Specimen”. Microscopy and Microanalysis (2009)

Abstract
Electron microscopy of whole cells in liquid with nanometer resolution

N. de Jonge, D. B. Peckys, G. J. Kremers, D. W. Piston

Proceedings of the National Academy of Sciences

2009

N. de Jonge, D. B. Peckys, G. J. Kremers, D. W. Piston. “Electron microscopy of whole cells in liquid with nanometer resolution”. Proceedings of the National Academy of Sciences (2009)

Abstract
Techniques for Consecutive TEM and Atom Probe Tomography Analysis of Nanowires

D Diercks, BP Gorman, CL Cheung, G Wang

Microscopy and Microanalysis

2009

D Diercks, BP Gorman, CL Cheung, G Wang. “Techniques for Consecutive TEM and Atom Probe Tomography Analysis of Nanowires”. Microscopy and Microanalysis (2009)

Abstract
Quantification of Interfacial Roughness of In2O3/ZrO2 Superlattice Films in 3D

X Zhong, B Kabius, D Schreiber, J Eastman, D Fong, A Petford-Long

Microscopy and Microanalysis

2009

X Zhong, B Kabius, D Schreiber, J Eastman, D Fong, A Petford-Long. “Quantification of Interfacial Roughness of In2O3/ZrO2 Superlattice Films in 3D”. Microscopy and Microanalysis (2009)

Abstract
Preferential Growth of Single-Walled Carbon Nanotubes with Metallic Conductivity

Avetik R. Harutyunyan, Gugang Chen, Tereza M. Paronyan, Elena M. Pigos, Oleg A. Kuznetsov, Kapila Hewaparakrama, Seung Min Kim, Dmitri Zakharov, Eric A. Stach, Gamini U. Sumanasekera

Science

2009

Avetik R. Harutyunyan, Gugang Chen, Tereza M. Paronyan, Elena M. Pigos, Oleg A. Kuznetsov, Kapila Hewaparakrama, Seung Min Kim, Dmitri Zakharov, Eric A. Stach, Gamini U. Sumanasekera. “Preferential Growth of Single-Walled Carbon Nanotubes with Metallic Conductivity”. Science (2009)

Abstract
Notch insensitive fracture in nanoscale thin films

S. Kumar, M. A. Haque, H. Gao

Applied Physics Letters

2009

S. Kumar, M. A. Haque, H. Gao. “Notch insensitive fracture in nanoscale thin films”. Applied Physics Letters (2009)

Abstract
In-Situ TEM Observation of Domain Behavior in Multiferroic Structures Under Applied DC Bias

C Winkler, L Martin, C Johnson, M Taheri

Microscopy and Microanalysis

2009

C Winkler, L Martin, C Johnson, M Taheri. “In-Situ TEM Observation of Domain Behavior in Multiferroic Structures Under Applied DC Bias”. Microscopy and Microanalysis (2009)

Abstract
Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis

Brian P Gorman, David Diercks, Norman Salmon, Eric Stach, Gonzalo Amador, Cheryl Hartfield

Microscopy Today

2008

Brian P Gorman, David Diercks, Norman Salmon, Eric Stach, Gonzalo Amador, Cheryl Hartfield. “Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis”. Microscopy Today (2008)

Abstract
Development of a high accuracy, large range and backlash free single-tilt/rotation (alpha-gamma) holder for precise alignment of TEM samples

N Salmon, D Vetter, EA Stach

Microscopy and Microanalysis

2008

N Salmon, D Vetter, EA Stach. “Development of a high accuracy, large range and backlash free single-tilt/rotation (alpha-gamma) holder for precise alignment of TEM samples”. Microscopy and Microanalysis (2008)

Abstract
FIB Milling of Frozen-hydrated Cells and Tissue for TEM Cryo-Tomography

M Marko, C Hsieh, N Salmon, M Rodriguez, J Frank, C Mannella

Microscopy and Microanalysis

2008

M Marko, C Hsieh, N Salmon, M Rodriguez, J Frank, C Mannella. “FIB Milling of Frozen-hydrated Cells and Tissue for TEM Cryo-Tomography”. Microscopy and Microanalysis (2008)

Abstract
Void Formation Induced Electrical Switching in Phase-Change Nanowires

Stefan Meister, David T. Schoen, Mark A. Topinka, Andrew M. Minor, Yi Cui

Nano  Letters

2008

Stefan Meister, David T. Schoen, Mark A. Topinka, Andrew M. Minor, Yi Cui. “Void Formation Induced Electrical Switching in Phase-Change Nanowires”.  Nano Letters (2008)

Abstract
Large Anisotropy of Electrical Properties in Layer-Structured In2Se3 Nanowires

Hailin Peng, Chong Xie, David T. Schoen, Yi Cui

Nano Letters

2008

Hailin Peng, Chong Xie, David T. Schoen, Yi Cui. “Large Anisotropy of Electrical Properties in Layer-Structured In2Se3 Nanowires”. Nano Letters (2008)

Abstract
In situ TEM studies of local transport and structure in nanoscale multilayer films

A.N.Chiaramonti, L.J.Thompson, W.F. Egelhoff, B.C. Kabius, A.K.Petford-Long

Ultramicroscopy

2008

A.N. Chiaramonti, L.J. Thompson, W.F. Egelhoff, B.C. Kabius, A.K. Petford-Long. “In situ TEM studies of local transport and structure in nanoscale multilayer films”. Ultramicroscopy (2008)

Abstract
Atom Probe Tomography of Electronic Materials

Thomas F. Kelly, David J. Larson, Keith Thompson, Roger L. Alvis, Joseph H. Bunton, Jesse D. Olson, Brian P. Gorman

Annual Review of Materials Research

2007

Thomas F. Kelly, David J. Larson, Keith Thompson, Roger L. Alvis, Joseph H. Bunton, Jesse D. Olson, Brian P. Gorman. “Atom Probe Tomography of Electronic Materials”. Annual Review of Materials Research (2007)

Abstract
Use of Focused Ion Beam Milling for Preparation of Frozen-Hydrated Specimens for TEM Tomography

M Marko, M Scheeff, N Salmon, C Hsieh, M Rodriguez, J Frank, C Mannella

Microscopy and Microanalysis

2007

M Marko, M Scheeff, N Salmon, C Hsieh, M Rodriguez, J Frank, C Mannella. “Use of Focused Ion Beam Milling for Preparation of Frozen-Hydrated Specimens for TEM Tomography”. Microscopy and Microanalysis (2007)

Abstract
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