Apply calibrated in-plane magnetic fields up to 900 Gauss during in-situ TEM, Lorentz TEM, and electron holography to correlate magnetic field stimuli with nanoscale structural and magnetic evolution

Controlled In-Plane Magnetic Fields for In-Situ TEM

The TEM Magnetizing Sample Holder is an in-situ TEM sample holder that applies calibrated in-plane magnetic fields directly to the specimen during imaging. Compatible with conventional TEM/STEM, Lorentz TEM, and electron holography, it generates defelction-compensated fields up to ±300 Gauss using an integrated electromagnet with built-in field sensing for precise control and calibration. Hummingbird Scientific's unique passive beam deflection compensation minimizes field-induced electron beam distortion, preserving image quality and enabling stable, high-resolution imaging throughout magnetic field experiments.

Designed for Advanced Magnetic and Quantum Materials Research

Investigate magnetic domain dynamics, magnetization reversal, domain wall motion, skyrmions, magnetic vortices, spin textures, and other field-driven phenomena in magnetic thin films, quantum materials, spintronic devices, permanent magnets, and low-dimensional magnetic systems. Directly correlate magnetic behavior with structural evolution to study field-responsive materials beyond the capabilities of ex-situ characterization.

Reveal Magnetic Field-Driven Mechanisms at the Nanoscale

Many magnetic materials exhibit reversible and/or transient behavior that exists only under applied magnetic field. Hummingbird Scientific's passive beam deflection compensation enables continuous observation during increasing, decreasing, and reversing magnetic fields, allowing researchers to investigate hysteresis, switching pathways, magnetic stability, and field-dependent material performance in real time.

TEM Magnetizing Sample Holder

Hummingbird Advantages:

  • Apply calibrated deflection-compensated in-plane magnetic fields up to ±300 Gauss directly to a specimen during in-situ TEM imaging.
  • Maintain stable, high-resolution imaging with unique passive beam deflection compensation during magnetic field application.
  • Perform TEM/STEM, Lorentz TEM, and electron holography using a single integrated magnetizing platform.
  • Measure the actual magnetic field at the specimen with a current-calibrated field sensor for reproducible experiments.
  • Observe magnetic domain dynamics, magnetization reversal, and other field-driven transformations in real time.
  • Large viewing-area magnetizing chips optimized for Lorentz TEM and low-magnification magnetic imaging.
  • In-house microfabricated magnetizing chips available from stock, with custom chip development for specialized magnetic materials and devices.
Technical Specs
1700 series
Sample Substrate Size
1 mm x 2 mm
In-Plane Applied Magnetic Flux Density
Up to ±300 Gauss, depending on microscope and pole piece
Electron Imaging
From -300 Gauss to +300 Gauss applied field during imaging depending on microscope and pole piece
Beam Deflection
Integrated passive magnetic beam deflection compensation

Available For:

How it Works

The TEM Magnetizing Sample Holder integrates magnetic field generation, field measurement, and dedicated control hardware into a unified platform for in-situ magnetic field experiments inside the TEM. Samples are first mounted onto compatible microfabricated chips, which are then inserted into the holder. An integrated electromagnet generates calibrated in-plane magnetic fields of up to ±300 Gauss directly at the specimen while imaging inside the TEM.

The applied magnetic field is continuously measured at the specimen using a built-in calibrated sensor, ensuring accurate field strength measurement throughout the experiment. Researchers can precisely control and cycle the magnetic field to study magnetic switching, domain wall motion, magnetization reversal, spin textures, and other field-driven phenomena in real time. A passive beam deflection compensation system counteracts field-induced electron beam distortion providing a usable range of ±300 Gauss of applied field for imaging, preserving stable TEM/STEM imaging and enabling high-quality TEM, Lorentz TEM, and electron holography during magnetic field application.

Image: (Top) Graph illustrating the maximum applied magnetic  field and the maximum field at which imaging is possible. (Bottom) Schematic showing the magnetic field lines for negative applied field.  The magnetic compensation circuit guides the field around and applies an opposite field above and below the sample position. Colored image to the left shows FEA results of the magnetic fields at the sample.

Key Features and Capabilities

Calibrated In-Plane Applied Magnetic Field

Generate precisely controlled in-plane magnetic fields of up to ±300 Gauss directly at the specimen during TEM and STEM imaging

Passive Beam Deflection Compensation

Maintain stable TEM imaging during magnetic field application with passive compensation of field-induced electron beam deflection

In-Stock Magnetizing Chips

Accelerate magnetic TEM experiments with compatible magnetizing chips that are in stock and ready to ship

Featured Research

Artificial skyrmions and antiskyrmions in Co/Pt multilayers observed by in-situ magnetizing Lorentz TEM

The Hummingbird Scientific TEM Magnetizing sample holder was used to investigate the magnetic stability and reversal behavior of artificially engineered skyrmions and antiskyrmions in ion-irradiated Co/Pt multilayer films. Combining in-situ magnetic field application with aberration-corrected Lorentz TEM, researchers directly observed the formation, evolution, and switching of topologically non-trivial spin textures under applied magnetic fields at room temperature. The holder enabled controlled manipulation of magnetic states while maintaining high-quality imaging, revealing how dipolar interactions stabilize artificial skyrmions and antiskyrmions without requiring Dzyaloshinskii–Moriya (DM) interactions. These observations provided key insight into the magnetic behavior of engineered spin textures relevant to future spintronic and magnonic devices.

Reference: S. Zhang, et al. Scientific Reports (2016). DOI: 10.1038/srep31248

Copyright © 2016 The Author(s). Published by SpringerNature. This article is distributed under the terms of the Creative CommonsAttribution 4.0 International License (CC BY 4.0).

High Impact Publications

Explore publications featuring the Hummingbird Scientific TEM Magnetizing Sample Holder and discover applications in magnetic domain imaging, spin textures, and field-driven magnetic phenomena.

In situ Lorentz TEM magnetization studies on a Fe-Pd-Co martensitic alloy

A. Budruk, C. Phatak, A.K. Petford-Long, M. De Graef

Acta Materialia

2011
In-situ Lorentz TEM Study of Magnetic Domain Wall Mobility in Amartensitic Ni-Mn-Ga Alloy

A Budruk, C Pathak, A Petford-Long, M De Graef

Microscopy and Microanalysis

2011
Domain Observations in Fe-Pd-Co by Dynamic in-situ Lorentz TEM

A Budruk, C Phatak, AK Petford-Long, M De Graef

Microscopy and Microanalysis

2010
Recent Progress in Lorentz Transmission Electron Microscopy

Marc De Graef

8th European Symposium on Martensitic Transformations

2009

Built on Engineering Excellence

Hummingbird Scientific designs, machines, assembles, tests, and services its products in-house. Our integrated engineering, machining, microfabrication, software development, applications, and service teams enable rapid rapid prototyping and iteration, custom modifications, and direct technical support throughout the life of the instrument. This vertically integrated approach allows researchers to adapt experimental platforms to unique scientific requirements while maintaining the performance and reliability required for advanced in-situ microscopy experiments.

The TEM Magnetizing Sample Holder is a direct result of these capabilities, bringing calibrated magnetic field control and passive beam deflection compensation together in a single experimental in-situ TEM platform.

Need something unique? Our engineers can customize existing products or develop entirely new solutions to support specialized experiments and emerging research challenges.

Frequently Asked Questions

What is a TEM Magnetizing Sample Holder?
What types of experiments can be performed with the TEM Magnetizing Sample Holder?
What type of magnetic field does the TEM Magnetizing Sample Holder generate?
How is the applied magnetic field measured and controlled in the TEM Magnetizing Sample Holder?
Does applying a magnetic field using the TEM Magnetizing Sample Holder affect TEM imaging?
How are samples prepared for the TEM Magnetizing Sample Holder?
Can EDS and EELS be performed with the TEM Magnetizing Sample Holder?
TEM Magnetizing
Technical Specs
1700 series
Sample Substrate Size
1 mm x 2 mm
In-Plane Applied Magnetic Flux Density
Up to ±300 Gauss, depending on microscope and pole piece
Electron Imaging
From -300 Gauss to +300 Gauss applied field during imaging depending on microscope and pole piece
Beam Deflection
Integrated passive magnetic beam deflection compensation
Instrument Type
TEM

Available For:

Full Product Information
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