Acta Materialia
Microscopy and Microanalysis
Microscopy and Microanalysis
8th European Symposium on Martensitic Transformations
The TEM Magnetizing Sample Holder is an in-situ TEM sample holder that applies calibrated in-plane magnetic fields directly to the specimen during imaging. Compatible with conventional TEM/STEM, Lorentz TEM, and electron holography, it generates defelction-compensated fields up to ±300 Gauss using an integrated electromagnet with built-in field sensing for precise control and calibration. Hummingbird Scientific's unique passive beam deflection compensation minimizes field-induced electron beam distortion, preserving image quality and enabling stable, high-resolution imaging throughout magnetic field experiments.
Investigate magnetic domain dynamics, magnetization reversal, domain wall motion, skyrmions, magnetic vortices, spin textures, and other field-driven phenomena in magnetic thin films, quantum materials, spintronic devices, permanent magnets, and low-dimensional magnetic systems. Directly correlate magnetic behavior with structural evolution to study field-responsive materials beyond the capabilities of ex-situ characterization.
Many magnetic materials exhibit reversible and/or transient behavior that exists only under applied magnetic field. Hummingbird Scientific's passive beam deflection compensation enables continuous observation during increasing, decreasing, and reversing magnetic fields, allowing researchers to investigate hysteresis, switching pathways, magnetic stability, and field-dependent material performance in real time.

The TEM Magnetizing Sample Holder integrates magnetic field generation, field measurement, and dedicated control hardware into a unified platform for in-situ magnetic field experiments inside the TEM. Samples are first mounted onto compatible microfabricated chips, which are then inserted into the holder. An integrated electromagnet generates calibrated in-plane magnetic fields of up to ±300 Gauss directly at the specimen while imaging inside the TEM.
The applied magnetic field is continuously measured at the specimen using a built-in calibrated sensor, ensuring accurate field strength measurement throughout the experiment. Researchers can precisely control and cycle the magnetic field to study magnetic switching, domain wall motion, magnetization reversal, spin textures, and other field-driven phenomena in real time. A passive beam deflection compensation system counteracts field-induced electron beam distortion providing a usable range of ±300 Gauss of applied field for imaging, preserving stable TEM/STEM imaging and enabling high-quality TEM, Lorentz TEM, and electron holography during magnetic field application.
Image: (Top) Graph illustrating the maximum applied magnetic field and the maximum field at which imaging is possible. (Bottom) Schematic showing the magnetic field lines for negative applied field. The magnetic compensation circuit guides the field around and applies an opposite field above and below the sample position. Colored image to the left shows FEA results of the magnetic fields at the sample.


Generate precisely controlled in-plane magnetic fields of up to ±300 Gauss directly at the specimen during TEM and STEM imaging

An integrated electromagnet generates calibrated in-plane magnetic fields directly at the specimen, enabling precise control over magnetic field strength throughout the experiment. Dedicated control hardware allows the field to be smoothly varied, reversed, or cycled, while a built-in miniature sensor continuously measures the applied field at the specimen by calibrated current measurements to ensure accurate stable imaging and reproducible experimental conditions.

Maintain stable TEM imaging during magnetic field application with passive compensation of field-induced electron beam deflection

Applying magnetic fields inside the TEM can deflect the electron beam and degrade image stability. The TEM Magnetizing Sample Holder incorporates a dedicated passive magnetic circuit that counteracts field-induced beam deflection, minimizing image shift and preserving beam alignment throughout magnetic field application. This integrated approach maintains imaging performance without requiring active correction or user intervention.

Accelerate magnetic TEM experiments with compatible magnetizing chips that are in stock and ready to ship

The TEM Magnetizing Sample Holder uses dedicated microfabricated silicon nitride magnetizing chips designed for reproducible in-situ magnetic field experiments. Manufactured in-house, these chips are kept in stock for rapid delivery, minimizing procurement delays and ensuring a reliable supply of consumables for ongoing research.

Comparison of simulated (left) artificial skyrmions and antiskyrmions to real skyrmion (top)and antiskyrmion (bottom) domains imaged using Lorentz TEM. Inset schematic illustrates artificial engineering process using ion irradiation.
Artificial skyrmions and antiskyrmions in Co/Pt multilayers observed by in-situ magnetizing Lorentz TEM
The Hummingbird Scientific TEM Magnetizing sample holder was used to investigate the magnetic stability and reversal behavior of artificially engineered skyrmions and antiskyrmions in ion-irradiated Co/Pt multilayer films. Combining in-situ magnetic field application with aberration-corrected Lorentz TEM, researchers directly observed the formation, evolution, and switching of topologically non-trivial spin textures under applied magnetic fields at room temperature. The holder enabled controlled manipulation of magnetic states while maintaining high-quality imaging, revealing how dipolar interactions stabilize artificial skyrmions and antiskyrmions without requiring Dzyaloshinskii–Moriya (DM) interactions. These observations provided key insight into the magnetic behavior of engineered spin textures relevant to future spintronic and magnonic devices.
Reference: S. Zhang, et al. Scientific Reports (2016). DOI: 10.1038/srep31248
Copyright © 2016 The Author(s). Published by SpringerNature. This article is distributed under the terms of the Creative CommonsAttribution 4.0 International License (CC BY 4.0).
Hummingbird Scientific designs, machines, assembles, tests, and services its products in-house. Our integrated engineering, machining, microfabrication, software development, applications, and service teams enable rapid rapid prototyping and iteration, custom modifications, and direct technical support throughout the life of the instrument. This vertically integrated approach allows researchers to adapt experimental platforms to unique scientific requirements while maintaining the performance and reliability required for advanced in-situ microscopy experiments.
The TEM Magnetizing Sample Holder is a direct result of these capabilities, bringing calibrated magnetic field control and passive beam deflection compensation together in a single experimental in-situ TEM platform.
Need something unique? Our engineers can customize existing products or develop entirely new solutions to support specialized experiments and emerging research challenges.
The TEM Magnetizing Sample Holder is an in-situ TEM sample holder that integrates magnetic field generation, real-time field measurement, and dedicated control hardware into a single platform. Samples are mounted onto compatible microfabricated chips and inserted into the holder, where an integrated electromagnet generates calibrated in-plane magnetic fields of up to ±900 Gauss directly at the specimen. The built-in sensor continuously measures current which is calibrated to different applied field strengths enabling accurate tuning of the applied field throughout the experiment while passive beam deflection compensation preserves stable TEM imaging during magnetic field application. The system provides precise software control of magnetic field strength and cycling, enabling reproducible magnetic field experiments without compromising imaging performance.
The TEM Magnetizing Sample Holder enables in-situ magnetic field experiments on a wide range of magnetic materials, including thin films, multilayers, patterned magnetic devices, permanent and soft magnets, spintronic materials, quantum materials, magnetic nanoparticles, and other ferromagnetic, ferrimagnetic, and antiferromagnetic systems. Researchers can apply controlled magnetic field cycles to study field-driven magnetization processes, including magnetic switching, domain wall motion, magnetization reversal, spin texture evolution, hysteresis behavior, and magnetic phase transitions, while imaging the specimen in real time using TEM, STEM, Lorentz TEM, or electron holography.
The TEM Magnetizing Sample Holder generates a calibrated in-plane magnetic field of up to ±900 Gauss directly at the specimen using an integrated electromagnet. The magnetic field is precisely software controlled and can be smoothly varied, reversed, or cycled throughout an experiment. Continuous field measurement at the specimen ensures accurate calibration and highly reproducible magnetic field application.
The TEM Magnetizing Sample Holder incorporates a calibrated current sensor to continuously measure the applied in-plane magnetic field during the experiment via provided calibrations. This real-time field measurement enables accurate calibration, closed-loop field control, and highly reproducible magnetic field cycling. By measuring the field directly at the specimen, the system ensures that the applied magnetic field matches the experimental conditions, providing confidence in quantitative magnetic measurements and comparisons between experiments.
The TEM Magnetizing Sample Holder is designed to maintain stable TEM imaging while applying in-plane magnetic fields. A passive beam deflection compensation system uses a dedicated magnetic circuit to counteract and minimize field-induced electron beam distortion, allowing the smallest possible image shift and simplifying beam alignment during magnetic field application. This enables high-quality TEM, STEM, Lorentz TEM, and electron holography imaging while magnetic fields of up to ±900 Gauss are applied directly to the specimen.
Samples are prepared by mounting them onto compatible microfabricated chips before the chips are inserted into the TEM Magnetizing Sample Holder. The holder uses dedicated 1 × 2 mm silicon nitride (SiN) substrate chips, providing a stable platform for a wide range of specimen preparation methods, including thin-film deposition, lithographically patterned devices, FIB-prepared lamellae, and nanoparticle dispersions. 1 × 2 mm electropolished coupon bulk samples can also made with specialized electropolishing fixtures. Ask us about these when you are interested in these types of specimens. The specimen is positioned within the calibrated magnetic field at the center of the chip, ensuring consistent magnetic field application and reproducible TEM imaging throughout the experiment.
The TEM Magnetizing Sample Holder is compatible with EELS (Electron Energy Loss Spectroscopy), enabling simultaneous spectroscopic analysis during in-situ magnetic field experiments. EDS (Energy-Dispersive X-ray Spectroscopy) is not supported, as the integrated electromagnet and magnetic circuit do not provide sufficient geometric clearance for efficient X-ray collection by the EDS detector.

