The TEM Tomography Sample Holder is a high-tilt TEM sample holder for electron tomography, conventional TEM/STEM imaging, and correlative atom probe tomography (APT) workflows. Its interchangeable removable tip architecture supports a wide range of specimen geometries, while its ultra-stable mechanical design minimizes drift, sample runout during tilting, and settling time after each tilt, enabling accurate three-dimensional reconstruction and reliable automated tilt-series acquisition.
Perform 3D characterization of nanoparticles, semiconductor devices, catalysts, battery materials, and biological specimens. Interchangeable sample tips accommodate 3 mm full grids, 3 mm half-grids, 1 mm grids, FIB lift-out specimens, APT needle specimens, microfabricated chips, and custom sample geometries, allowing a single holder to support diverse characterization and correlative microscopy workflows.
High-quality tomography depends on maximizing specimen tilt while minimizing shadowing. By selecting the most appropriate removable tip for each specimen, researchers can improve reconstruction fidelity and reveal buried interfaces, pore networks, device architectures, and other complex internal structures with greater accuracy.
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The TEM Tomography Sample Holder integrates interchangeable removable sample tips into a flexible platform for high angle single-tilt electron tomography, conventional TEM/STEM imaging, and correlative atom probe tomography (APT). Samples are mounted onto the removable tip best suited to the specimen geometry before the tip is inserted into the holder for imaging and tomography experiments.
A range of removable tip configurations supports 3 mm and 1 mm grids, FIB lift-out specimens, APT needle specimens, microfabricated chips, and custom sample geometries. Each tip is designed to maximize accessible tilt while minimizing sample shadowing, helping researchers obtain higher-quality three-dimensional tomographic reconstructions.
While specifically engineered for automated tilt-series acquisition and tomographic reconstruction workflows, the holder is also widely used as a general-purpose single-tilt holder thanks to its exceptional stability, ease of use, and compatibility with a wide range of sample substrates. The removable tips allow the same specimen to be transferred between TEM tomography and atom probe tomograpy (APT) mounting systems, enabling direct correlative three-dimensional characterization.
Configure the holder for virtually any tomography specimen using removable, application-specific sample tips
Simplify specimen mounting with dedicated fixtures that securely position removable sample tips during sample loading
Directly mount compatible half-grid and single-point needle tips in FIB and CAMECA™ APT systems for efficient correlative characterization
(a)TEM-based bright-field image of specimen tip. (b) PED-based LOS map. (c) APT-based reconstruction of the 6 at % segregated Au isosurface superimposed on (a). (d) Spatial distribution of Pt(green) and Au (gold) atoms in the specimen tip superimposed on (c). (e) Au at% profiles across defects shown in (f). (f) Each observed defect type, corresponding defect symbols, DMD simulation result, and location on Pt-Au phase diagram.
Correlative TEM–APT mapping of defect-specific Au segregation in Pt–Au alloys
The Hummingbird Scientific TEM Tomography sample holder was used in a correlative atom probe tomography (APT) workflow to connect defect structure with local chemistry in a Pt–7 at.% Au model alloy. Following FIB preparation, the same specimen remained on the removable tomography holder tip which was transferred between TEM and atom probe instruments for sequential analysis. TEM and precession electron diffraction identified individual dislocations, grain boundaries, stacking-fault tetrahedra, and faulted loops, while APT provided three-dimensional chemical reconstructions of Au segregation at these defects. This cross-correlative workflow revealed defect-specific solute decoration patterns far more diverse than predicted by classical theory, demonstrating how combined TEM and APT analysis can uncover previously hidden structure–chemistry relationships in materials.
Reference: X. Zhou, et al. Science Advances (2021). DOI:10.1126/sciadv.abf0563
Copyright © 2021 The Authors. Published by the American Association for the Advancement of Science under the Creative Commons Attribution-NonCommercial 4.0 International License (CC BY-NC 4.0).
Series of micrographs showing an Au nanoparticle affixed to a rotating Ge nanowire under TEM, demonstrating the highly concentric sample rotation required for tomographic reconstructions.
Tilt series collection of a rotating Ge nanowire with affixed Au nanoparticle
This video demonstrates the exceptionally low runout Tomography sample holder during tilt series image collection. As a holder rotates, deflections along the entire length of the holder can contribute to runout, shifting, and misalignment of the sample, impeding tomographic tilt series image collection. The precise and accurate rotation transferred to a 150 nm diameter Ge nanowire from the TEM goniometer is demonstrated. An affixed Au nanoparticle is shown rotating and passing behind the nanowire in precise steps using Z-contrast STEM.
Hummingbird Advantages
Reference: Jinsong Wu, et al, Journal of Physical Chemistry C (2013). DOI: 10.1021/jp310816f
Video Copyright © 2012 American Chemical Society
Hummingbird Scientific designs, machines, assembles, tests, and services its products in-house. Our integrated in-house engineering, precision manufacturing, microfabrication, software development, applications, and service teams enable rapid product development, custom modifications, and direct technical support throughout the life of the instrument.
The TEM Tomography Sample Holder is a direct result of these capabilities, integrating ultra-stable holder design with interchangeable sample tips to support high-fidelity electron tomography, conventional TEM/STEM imaging, and correlative atom probe tomography workflows.
Need something unique? Our engineers can customize existing tomography tips or develop entirely new holder and tip configurations to support specialized specimen geometries, novel workflows, and emerging research challenges.
