TEM Software Publications Library

The paper demonstrates STEM-EELS and EFTEM spectral imaging for screening individual nanostructures. The combined methodology delivers spatially resolved chemical and electronic characterization at the nanoscale.

The authors apply FE-SEM image analysis techniques to characterize toner particle shape and morphology. Quantitative measurements provide insight into particle properties that influence printing performance.

The paper reviews advances in automatic orientation mapping based on transmission electron microscopy. The methodology enables efficient crystallographic characterization and supports detailed microstructural analysis.

The authors present cryo-focused ion beam methods for thinning cryo-TEM specimens while minimizing ice contamination during transfer. The technique improves sample quality and supports high-resolution cryogenic imaging.

This work investigates the geometry of electron backscatter diffraction within a scanning electron microscope. Simulations and visual representations help clarify signal generation and detector configuration effects.

The paper investigates phase segregation phenomena in laser-crystallized polycrystalline SiGe thin films. The findings improve understanding of compositional redistribution and microstructural evolution during processing.

The paper explores visualization techniques for plant data using non-negative matrix factorization. The approach extracts meaningful patterns and supports interpretation of complex biological datasets.

This study applies Rietveld texture analysis to synchrotron diffraction images of zirconium. Quantitative orientation distributions are extracted from a single diffraction image to characterize preferred crystallographic textures.

The paper presents a silicon-based photon-counting X-ray detector developed for synchrotron applications. The technology improves detection efficiency, counting accuracy, and measurement sensitivity.

This article reviews three-dimensional X-ray diffraction microscopy as a tool for non-destructive characterization of crystalline materials. The method provides insight into grain structures, orientations, and internal defects within bulk samples.

This work demonstrates terahertz near-field imaging using coherent synchrotron radiation. The approach achieves sub-diffraction-limited spatial resolution for advanced spectroscopy and imaging applications.

XMIPP introduces an open-source image-processing package designed for electron microscopy research. The software includes tools for classification, alignment, reconstruction, and quantitative image analysis.

This work describes methods for extracting and visualizing biological structures from electron tomograms. The techniques enhance interpretation of complex cellular datasets and three-dimensional features.

This chapter provides an overview of transmission electron microscopy and spectroscopy techniques. The discussion outlines imaging, diffraction, and spectroscopic methods used to investigate nanoscale materials.

The authors investigate dislocation nucleation and propagation during compressive thin-film deposition. Computational analysis helps explain defect formation and stress-relief mechanisms in growing films.

This research presents misorientation mapping techniques based on EBSD for visualizing plastic deformation. The approach highlights strain localization patterns and supports quantitative assessment of material response.

This chapter reviews the crystal chemistry of superconducting rare-earth cuprates. The discussion links atomic structure, composition, and superconducting behavior in these technologically important materials.

This paper compares particle-size measurements obtained from field-emission SEM and TEM images. The analysis evaluates consistency between techniques and highlights factors affecting measurement accuracy.

Leginon automates image acquisition from cryogenic electron microscopy specimens. The system improves data collection efficiency, consistency, and throughput while reducing manual intervention.

The authors discuss monochromatic X-ray computed tomography performed with synchrotron radiation sources. The approach provides high image quality and improved quantitative characterization compared with conventional methods.