TEM Software Publications Library

The authors discuss practical strategies for analyzing EBSD datasets. The chapter covers interpretation techniques and data-processing methods used in crystallographic characterization.

This study explores neural network methods for two-dimensional phase retrieval problems. The proposed approach reconstructs phase information from measured data while reducing computational complexity.

This work describes beamline instrumentation and experimental applications of synchrotron-radiation X-ray fluorescence at LNLS. The setup supports detailed elemental analysis across diverse research fields.

This work discusses methods for visualization and parameter estimation in neutron scattering data analysis. The techniques support interpretation of experimental results and extraction of physical insights.

The authors examine micro-scale small-angle X-ray scattering experiments performed with synchrotron radiation. The technique supports structural investigations of polymers, biological samples, and complex materials.

This article examines synchrotron energy-dispersive X-ray diffraction tomography for spatially resolved materials characterization. The technique combines diffraction and tomographic imaging to reveal internal structural information.

This chapter reviews synchrotron X-ray fluorescence analysis as a powerful tool for elemental characterization. High sensitivity and multi-element detection capabilities support a wide range of scientific applications.

The authors review analytical electron microscopy methods for thin-film analysis and chemical mapping. The techniques enable spatially resolved characterization of composition, interfaces, and microstructural features.

This study demonstrates atomic-resolution imaging techniques for investigating ferroelectric domain structures. The observations provide direct insight into polarization behavior and nanoscale domain configurations.

The authors present NeXus as a common data format for exchanging neutron and synchrotron experimental data. Standardization improves interoperability, data sharing, and long-term usability across facilities.

IMOD presents a comprehensive environment for visualizing and modelling three-dimensional microscopy datasets. The software enables interactive exploration, segmentation, and interpretation of volumetric image information.

This article reviews orientation imaging microscopy applications for characterizing grain-boundary networks. The approach provides quantitative insight into microstructure, texture, and material behavior.

This study analyzes the contributions of elastic and inelastic multiple scattering in EELS measurements. The results improve understanding of signal formation and quantitative spectral interpretation.

This work investigates efficient extraction-window designs for high-throughput synchrotron X-ray lithography beamlines. The proposed configuration enhances operational performance and reliability.

This paper investigates the sintering behavior of nanoscale zirconia particles through in-situ TEM observations. Real-time imaging reveals grain growth, densification, and microstructural evolution during heating.

This work demonstrates how symmetry considerations can reduce computational effort in frozen phonon simulations. The strategy accelerates calculations while preserving accuracy in electron scattering studies.

This work describes source and release control practices for EPICS applications. The framework supports reliable management of software used in experimental physics and industrial control systems.

The study presents high-resolution synchrotron X-ray diffraction tomography of polycrystalline materials. The method enables non-destructive three-dimensional characterization of strain and microstructural features.

This paper investigates phase transformations in Fe-Al alloys through in-situ TEM heating experiments. The observations track domain evolution and antiphase boundary behavior during thermal processing.

This work investigates time-resolved spectroscopy of scintillation materials using synchrotron X-ray radiation. Measurements of luminescence spectra and decay kinetics provide insight into scintillator performance.