Key publications, open-source tools, and research directions in TEM automation, 4D-STEM, tomography, and AI-assisted microscopy.

Software is now central to modern transmission electron microscopy. Today’s TEM and STEM workflows depend on automated acquisition, microscope scripting, detector synchronization, tomography reconstruction, 4D-STEM analysis, machine learning, and increasingly autonomous experimental control.

This publication library curates influential papers, software platforms, and research directions that have shaped the software ecosystem for modern electron microscopy.

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Data Analysis Software
10.1016/0304-3991(87)90007-6
TEM
EELS quantification of M edges by using oxidic standards
Ferdinand Hofer
Ultramicroscopy
1987

This study presents quantitative EELS methods based on oxidic reference standards for M-edge analysis. The approach improves elemental measurement accuracy and facilitates reliable compositional characterization.

Data Analysis Software
10.1063/1.337872
X-ray
Line-broadening analysis of synchrotron x-ray diffraction data
T. C. Huang, M. Hart, W. Parrish, N. Masciocchi
Journal of Applied Physics
1987

This study investigates line-broadening analysis of synchrotron X-ray diffraction data to extract microstructural information. The technique is used to evaluate crystallite size, strain, and material defects.

Data Analysis Software
10.1117/12.949751
SEM
Edge Recognition in SEM Metrology
J. F. Mancuso, S. Erasmus
1986

The paper discusses edge-recognition strategies in SEM metrology. Accurate edge detection is essential for dimensional measurements and quality control in microfabrication and semiconductor applications.

Data Analysis Software
10.1126/science.231.4742.1070
X-ray
Stanford Synchrotron X-Ray Beamline Dedicated
Arthur L. Robinson
Science
1986

The report highlights the dedication of a Stanford synchrotron X-ray beamline and its significance for scientific research. The facility expanded opportunities for advanced X-ray investigations across multiple disciplines.

Open-Source TEM Software
10.1364/SWCR.1986.MC1
X-ray
X-Ray Microscopy Experiments with Synchrotron Radiation.
G. Schmahl
Topical Meeting on Short Wavelength Radiation: Generation and Applications
1986

This article reviews X-ray microscopy experiments performed with synchrotron radiation. Advanced optical systems and bright X-ray sources provide high-resolution imaging of microscopic structures.

Data Analysis Software
10.1093/oxfordjournals.jmicro.a050506
TEM
Computed Deconvolution in Electron Energy Loss Spectroscopy (EELS)
Journal of Electron Microscopy
1985

This work examines computational deconvolution techniques for electron energy-loss spectroscopy measurements. The method enhances spectral clarity and enables more accurate analysis of fine structural features.

AI and Autonomous Microscopy Software
10.1016/0304-3991(85)90120-2
TEM
The determination of atomic positions in high-resolution electron micrographs
W.O. Saxton, David J. Smith
Ultramicroscopy
1985

This classic work presents methods for determining atomic positions from high-resolution electron micrographs. The approach enables precise structural measurements at near-atomic scales.

Simulation Software
10.1107/S0108767384086669
TEM
Diffraction groups of CBED patterns
P. Goodman
Acta Crystallographica Section A Foundations of Crystallography
1984

This work examines diffraction symmetry groups observed in convergent beam electron diffraction patterns. The analysis establishes a framework for crystal symmetry determination from CBED measurements.

In-Situ TEM Software
10.1038/286584a0
TEM
Photoelectrochemical conversion using reaction-centre electrodes
A. Frederick Janzen, Michael Seibert
Nature
1980

The paper explores photoelectrochemical energy conversion using reaction-centre electrodes inspired by biological systems. The approach investigates mechanisms for converting light energy into usable electrical or chemical energy.

In-Situ TEM Software
10.1016/0029-554X(79)90105-8
TEM
A high-pressure thin-window gas cell
R.C. Haight, C. Rambo, J. Cormier, J.L. Garibaldi
Nuclear Instruments and Methods
1979

This work describes the design of a high-pressure thin-window gas cell for experimental studies. The device enables controlled investigation of materials and reactions under elevated gas pressures.

In-Situ TEM Software
10.1017/S0424820100109343
TEM
In situ TEM studies of NaCl-gas reactions
T.T. Chung, J. Dash, R.J. O'Brien
Proceedings, annual meeting, Electron Microscopy Society of America
1978

The authors use in-situ TEM to study reactions between sodium chloride and gaseous environments. The experimental setup enables direct visualization of aerosol-gas interactions and reaction dynamics.

In-Situ TEM Software
10.1016/0375-9601(74)90831-7
TEM
Ionic polarons in solid electrolytes
F.G. Mahan, W.J. Pardee
Physics Letters A
1974

This work investigates ionic polarons in solid electrolytes and their influence on charge transport. The theoretical analysis contributes to understanding conduction mechanisms in ionic materials.

10.1016/0029-554X(73)90291-7
TEM
Correction to electron beam monitor papers
J.S. Pruitt
Nuclear Instruments and Methods
1973

This publication provides corrections and updates related to previous electron beam monitor studies. The note clarifies earlier findings and ensures the accuracy of the scientific record.

Simulation Software
10.2136/sssaj1972.03615995003600020015x
TEM
Source‐Detector Geometry Effect on Neutron Probe Calibration
G. N. McCauley, J. F. Stone
Soil Science Society of America Journal
1972

The study examines how source-detector geometry influences neutron probe calibration. The findings improve measurement consistency and support more accurate interpretation of detector responses.

4D-STEM Software
10.1021/ed049p237
X-ray
X-ray diffraction by crystal planes in real space and reciprocal space
S. F. Pavkovic
Journal of Chemical Education
1972

This educational article explains X-ray diffraction from crystal planes using both real-space and reciprocal-space perspectives. The discussion helps students develop a deeper understanding of crystallographic diffraction phenomena.

Data Analysis Software
10.1103/PhysRev.177.797
TEM
Statistical Theory for Displacement Ferroelectrics
M. E. Lines
Physical Review
1969

The paper develops a statistical framework for understanding displacement ferroelectrics. The theory explains collective behavior and phase transitions in materials exhibiting ferroelectric properties.

10.1016/0016-0032(62)90699-3
TEM
Heat, mass and momentum transfer
Journal of the Franklin Institute
1962

This article examines the fundamental principles governing heat, mass, and momentum transport phenomena. It provides theoretical insights that underpin engineering analysis of coupled transfer processes across many applications.

Data Analysis Software
10.1007/BF02746096
X-ray
Experimental facilities of the CERN proton synchrotron
A. Citron, M. G. N. Hine
Il Nuovo Cimento
1955

The authors review the experimental facilities associated with the CERN proton synchrotron. The paper outlines the infrastructure and research opportunities available for particle physics investigations.

Data Analysis Software
10.25080/gpna7794
TEM
HyperSpy: Your Multidimensional Data Analysis Toolbox
Joshua Taillon
SciPy. Python in Science Conference

HyperSpy is introduced as an open-source ecosystem for reproducible multidimensional data analysis. It combines interactive processing, visualization, and advanced analytical capabilities within the scientific Python landscape.

Data Analysis Software
10.30827/Digibug.66333
SEM
SEM, EBSD, laser confocal microscopy and FE-SEM data from modern Glycymeris shell layers
Gaia Crippa

This dataset provides SEM, EBSD, laser confocal microscopy, and FE-SEM data from modern Glycymeris shell layers. The collection supports multidisciplinary studies of shell structure, composition, and biomineralization.

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