Key publications, open-source tools, and research directions in TEM automation, 4D-STEM, tomography, and AI-assisted microscopy.

Software is now central to modern transmission electron microscopy. Today’s TEM and STEM workflows depend on automated acquisition, microscope scripting, detector synchronization, tomography reconstruction, 4D-STEM analysis, machine learning, and increasingly autonomous experimental control.

This publication library curates influential papers, software platforms, and research directions that have shaped the software ecosystem for modern electron microscopy.

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10.1080/02678299308027813
TEM
Domain structures in ferroelectric liquid crystals
V. P. Vorflusev, Yu. P. Panarin, S. A. Pikin, V. G. Chigrinov
Liquid Crystals
1993

This research investigates domain formation and evolution in ferroelectric liquid crystals. The findings provide insight into polarization behavior and the mechanisms governing domain structure development.

Data Analysis Software
10.1107/S0021889892010665
X-ray
Indexing unit cells from synchrotron X-ray powder diffraction data
R. J. Cernik, D. Louër
Journal of Applied Crystallography
1993

The authors discuss methods for indexing unit cells from synchrotron X-ray powder diffraction measurements. Accurate indexing provides the foundation for subsequent crystal-structure determination.

Data Analysis Software
10.1109/36.225529
SEM
SEM algorithm and unsupervised statistical segmentation of satellite images
P. Masson, W. Pieczynski
IEEE Transactions on Geoscience and Remote Sensing
1993

This paper presents an unsupervised statistical segmentation approach for image analysis based on the SEM algorithm. The methodology is applied to satellite imagery for automated feature extraction and classification.

Data Analysis Software
10.1117/12.136017
X-ray
Design of synchrotron x-ray lithography beamlines
James M. Oberschmidt, Robert P. Rippstein, Raymond R. Ruckel, Alek C. Chen, John C. Granlund, Alfred E. Palumbo
1992

This paper discusses design considerations for synchrotron X-ray lithography beamlines. Optimized beamline configurations enhance performance for microfabrication and precision lithographic applications.

In-Situ TEM Software
10.1017/S0424820100122022
TEM
In situ TEM of silicon oxidation
J. Murray Gibson, F.M. Ross, R.D. Twesten
Proceedings, annual meeting, Electron Microscopy Society of America
1992

This study investigates silicon oxidation using in-situ TEM techniques. Direct observation of oxidation processes improves understanding of mechanisms important to electronic device fabrication.

AI and Autonomous Microscopy Software
10.1093/oxfordjournals.jmicro.a050870
TEM
Assessment of Image Formation by Three-Dimensional Power Spectrum in Transmission Electron Microscopy
Journal of Electron Microscopy
1991

The study evaluates image formation in transmission electron microscopy using three-dimensional power spectrum analysis. The technique offers insight into imaging performance and information transfer characteristics.

Open-Source TEM Software
10.2307/4612348
TEM
Editorial: Readers Beget Readers; Writers Beget Writers
Robert S. Fogarty
The Antioch Review
1991

The editorial reflects on the relationship between reading and writing within scholarly and literary communities. It emphasizes how engagement with published work fosters stronger communication and knowledge creation.

In-Situ TEM Software
10.1007/978-1-4684-5835-0_23
TEM
A Mitochondrial Carrier Family for Solute Transport
Martin Klingenberg
Bioenergetics
1990

This chapter reviews the mitochondrial carrier family responsible for transporting solutes across biological membranes. The discussion highlights their structure, function, and importance in cellular energy metabolism.

In-Situ TEM Software
10.1016/S0304-8853(10)80005-8
TEM
Field-induced magnetic phase transitions
M. Date
Journal of Magnetism and Magnetic Materials
1990

The article reviews magnetic phase transitions induced by external fields. The discussion addresses fundamental mechanisms governing magnetic ordering and transformation phenomena.

Simulation Software
10.1017/S0424820100173698
TEM
HRTEM simulation of amorphous materials
Michael A. O’Keefe, Margaret L. Sattler
Proceedings, annual meeting, Electron Microscopy Society of America
1990

The article discusses simulation strategies for interpreting HRTEM images of amorphous materials. The modeling approach aids structural analysis where conventional crystallographic methods are insufficient.

10.1051/jphyscol:1990170
TEM
INTERACTION BETWEEN PRECIPITATES AND MIGRATING GRAIN BOUNDARIES
E. Bouchaud, S. Naka, H. Octor
Le Journal de Physique Colloques
1990

This study examines how precipitates influence the migration of grain boundaries within materials. The results contribute to understanding microstructural evolution and its impact on material properties.

Open-Source TEM Software
10.1017/S0424820100158248
TEM
Microwaves: Application in Electron Microscopy
Anthony S-Y Leong, David W Gove
Proceedings, annual meeting, Electron Microscopy Society of America
1990

The paper discusses the use of microwave technology in electron microscopy sample preparation and processing. The method offers potential benefits in speed, efficiency, and specimen handling.

Data Analysis Software
10.1017/S0424820100155074
TEM
A computer-control program for TEM in situ fatigue experiments
Kenneth S. Vecchio, John A. Hunt
Proceedings, annual meeting, Electron Microscopy Society of America
1989

The paper describes a computer-controlled system for automating TEM in-situ fatigue experiments. The software improves experimental consistency and supports detailed studies of microstructural evolution under cyclic loading.

Data Analysis Software
10.1016/0165-6074(89)90133-6
X-ray
Data exchange formats for testing
Johannes Pfeifer, Michael Wahl, Hans Wojtkowiak
Microprocessing and Microprogramming
1989

This paper examines data-exchange formats designed for testing and measurement applications. Standardized formats facilitate communication, interoperability, and efficient data processing across systems.

Open-Source TEM Software
10.1146/annurev.ms.19.080189.001151
X-ray
Dynamical Diffraction Imaging (Topography) with X-Ray Synchrotron Radiation
M Kuriyama, B W Steiner, R C Dobbyn
Annual Review of Materials Science
1989

The authors examine dynamical diffraction imaging and topography using synchrotron radiation. These techniques reveal crystal defects, strain distributions, and structural variations in materials.

Data Analysis Software
10.1016/0168-9002(89)90049-1
X-ray
Heating chambers for synchrotron X-ray experiments
F. Neissendorfer, G. Fischer, H.J. Rossa
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
1989

This article discusses the design and application of heating chambers for synchrotron X-ray experiments. The equipment supports in-situ studies of materials under elevated-temperature conditions.

Data Analysis Software
10.1117/12.961819
X-ray
Imaging Plate Detector In X-Ray Diffraction Using Synchrotron Radiation
Yoshiyuki Amemiya, Atsushi Nakagawa, Shunji Kishimoto, Tadashi Matsushita, Masami Ando, Jun-ichi Chikawa, Junji Miyahara
1989

The study evaluates imaging plate detectors for X-ray diffraction experiments using synchrotron radiation. The detector technology improves data acquisition efficiency and diffraction measurement capabilities.

In-Situ TEM Software
10.1016/0001-6160(88)90218-0
TEM
Discontinuous precipitation and coarsening in Al-Zn alloys
C.F. Yang, G. Sarkar, R.A. Fournelle
Acta Metallurgica
1988

This research investigates discontinuous precipitation and subsequent coarsening behavior in aluminum-zinc alloys. The findings improve understanding of phase transformation kinetics and microstructure evolution.

In-Situ TEM Software
10.1002/pssa.2211090208
TEM
In situ TEM studies of para—ferro phase transitions in NaNbO3
Jun Chen, Duan Feng
Physica Status Solidi (a)
1988

This study examines paraelectric-to-ferroelectric phase transitions in sodium niobate using in-situ TEM techniques. Direct observations help clarify structural changes associated with phase transformation behavior.

Data Analysis Software
10.1017/S042482010012552X
TEM
A new background extrapolation procedure for quantification in EELS
D.-R. Liu, D. B. Williams
Proceedings, annual meeting, Electron Microscopy Society of America
1987

The paper proposes a new background extrapolation strategy for quantitative EELS analysis. The procedure improves edge extraction accuracy and strengthens detection of low-concentration elements.

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