TEM Software Publications Library

The authors review deep learning approaches for denoising low-dose CT images. These techniques improve image quality while helping reduce radiation exposure during medical imaging procedures.

The paper develops lightweight image-processing methods for in-situ TEM experiments with an emphasis on live analysis. These tools enable faster interpretation of dynamic processes during data acquisition.

The authors examine how electron beams interact with and damage thin TEM specimens during imaging. The work provides insights into radiation effects and strategies for preserving sample integrity.

The publication surveys Brazilian initiatives implementing FAIR principles for research data management. It documents practical experiences and promotes broader adoption of open and reusable data practices.

This paper presents a framework for reducing storage and acquisition burdens in 4D-STEM through compressive sensing and data compression. The method preserves valuable information while lowering dataset size requirements.

This work explores environmental TEM techniques for observing materials under gas-phase conditions. The approach enables direct study of reactions, phase changes, and catalytic processes under realistic environments.

The paper presents a liquid-cell TEM holder capable of simultaneously applying electrochemical and thermal stimuli. The platform expands opportunities for studying complex dynamic processes under controlled experimental conditions.

This work introduces a FAIR research data management infrastructure tailored for electron microscopy and materials science. The framework improves data discoverability, accessibility, interoperability, and long-term reuse.

The study presents a multi-distance phase-retrieval method for characterizing metalens phase modulation. Accurate phase measurements support the optimization and performance evaluation of advanced optical devices.

This study investigates electrostatic beam blanking as a strategy for reducing beam damage in MoS2 during TEM analysis. The technique preserves specimen integrity while maintaining useful imaging performance.

The paper applies precession-assisted 4D-STEM to improve strain characterization in semiconductor devices. Enhanced diffraction data quality enables more accurate measurement of nanoscale deformation and crystal distortions.

This article describes the use of DIALS for processing serial synchrotron crystallography diffraction datasets. The workflow streamlines indexing, integration, and analysis of high-throughput crystallographic experiments.

This review examines variational autoencoders for processing and generating three-dimensional data. The models provide efficient latent representations that support reconstruction, synthesis, and analysis tasks.

This paper describes the Pycroscopy ecosystem, a collection of software packages for microscopy data analytics. The framework addresses challenges in data management, processing, and knowledge extraction across diverse modalities.

This work applies machine learning to automate electron tomography reconstruction and parameter selection. The system reduces manual tuning requirements and helps generate high-quality volumetric reconstructions.

This study introduces a complementary ADF-STEM methodology for quantitative 4D-STEM analysis. The technique enhances flexibility in signal interpretation and enables reliable extraction of specimen properties.

This paper presents a Bluesky-based data-acquisition system developed for the Shanghai Synchrotron Radiation Facility. The platform supports high-throughput experiments and flexible beamline operation.

The FAIR Data Point architecture provides a standardized framework for publishing machine-actionable metadata. The approach supports FAIR data principles and improves interoperability across scientific repositories.

The authors propose methods for reconstructing fiber orientations from SEM images of fiber-reinforced composites. The technique supports quantitative assessment of microstructure and material performance.

This study employs pulsed electrical biasing within TEM to examine microstructural responses in AA7075 alloys. The technique provides insight into electrically assisted processing and material behavior.