TEM Software Publications Library

The paper explores ultraviolet-light-induced resistive switching in hybrid polymer metal-oxide memristors. The approach demonstrates optical control of resistance states for advanced electronic devices.

This research applies weakly supervised learning and synthetic datasets to instance segmentation of SEM images. The methodology reduces annotation requirements while maintaining effective object identification performance.

xrdfit is a Python package developed for fitting synchrotron X-ray diffraction spectra. The software enables reproducible and efficient analysis of diffraction peaks and structural parameters.

This paper explores three-dimensional electron ptychography for volumetric imaging of materials. The method reconstructs internal structure with high resolution by combining information from multiple diffraction measurements.

Bluesky is a collaborative software project for scientific data acquisition and management across research facilities. Its modular architecture enables flexible experiment control and reproducible data workflows.

The study explores the behavior of nanoscale liquids confined within graphene liquid cells using in-situ TEM. Observations reveal fluid dynamics, interfacial phenomena, and particle interactions at high spatial resolution.

This work examines the failure mechanics of two-dimensional materials. The discussion explores fracture, defect interactions, and mechanical reliability in atomically thin structures.

This work describes an open-source synthetic aperture radar simulator accelerated using GPU-based FDTD computations. The platform delivers faster simulations while maintaining accuracy for radar imaging studies.

ilastik combines interactive machine learning with user-friendly image-analysis workflows. The software enables rapid segmentation, classification, and object identification without requiring extensive programming expertise.

This work enhances strain mapping precision in 4D-STEM through the use of patterned electron probes. The technique increases measurement sensitivity and enables more reliable characterization of nanoscale lattice distortions.

The authors use nanodiffraction strain mapping to investigate metallic glasses during in-situ deformation. The technique reveals local strain distributions and deformation pathways with high spatial resolution.

The paper proposes strategies for selecting reflectors used in EBSD pattern indexing. Improved ranking of diffraction features enhances indexing reliability and crystallographic analysis accuracy.

This study presents a semantic segmentation approach for SEM images of concrete using contextual labels. The method improves identification of material phases and supports automated microstructural characterization.

This work proposes strategies for optimizing disk space utilization in semiconductor workflow environments. The framework helps organizations reduce storage overhead while maintaining efficient access to engineering data.

This review describes software tools used to automate transmission electron microscopy acquisition. It explains how image analysis, microscope control, targeting, navigation, and data handling can be combined into practical automated workflows.

This work uses precession electron diffraction to map strain and crystal orientation within a germanium microdisk device. The analysis reveals local deformation patterns relevant to semiconductor and photonic applications.

The study applies operando synchrotron X-ray computed tomography to battery pouch cells. Three-dimensional imaging enables direct observation of structural changes during battery operation.

This study introduces an ultrafast linear array detector designed for real-time imaging applications. The system enables rapid data acquisition while supporting high temporal resolution measurements.

The article reviews FIB-SEM tomography as a powerful volume microscopy technique in biological research. The approach enables three-dimensional visualization of cellular and tissue architecture with nanometer-scale detail.

This study introduces X-ray Fourier ptychography as a high-resolution imaging approach. The technique increases image resolution and sensitivity by combining multiple diffraction measurements computationally.