Key publications, open-source tools, and research directions in TEM automation, 4D-STEM, tomography, and AI-assisted microscopy.

Software is now central to modern transmission electron microscopy. Today’s TEM and STEM workflows depend on automated acquisition, microscope scripting, detector synchronization, tomography reconstruction, 4D-STEM analysis, machine learning, and increasingly autonomous experimental control.

This publication library curates influential papers, software platforms, and research directions that have shaped the software ecosystem for modern electron microscopy.

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Microscope Automation Software
10.1017/S1431927618004816
TEM
Advanced Data Acquisition From Electron Microscopes With SerialEM
David N. Mastronarde
Microscopy and Microanalysis
2018

This paper reviews advanced data acquisition capabilities available through the SerialEM platform. The software improves automation and efficiency for complex electron microscopy experiments.

Tomography Software
10.1093/bioinformatics/btx653
TEM
A fast fiducial marker tracking model for fully automatic alignment in electron tomography
Renmin Han, Fa Zhang, Xin Gao
Bioinformatics
2018

The authors develop a fast fiducial-marker tracking model for automated alignment in electron tomography. The algorithm improves processing speed and supports large-scale reconstruction workflows.

Tomography Software
10.1007/978-3-319-68997-5_7
TEM
Alignment of Tilt Series
A. Verguet, C. Messaoudi, C. O. S. Sorzano, S. Marco
Cellular Imaging
2018

This chapter discusses methods for aligning tilt-series datasets used in electron tomography. Accurate registration of projection images improves reconstruction quality and enables more reliable three-dimensional analysis.

Open-Source TEM Software
10.1007/978-981-13-1316-5_49
X-ray
Application of the SOPHIAS Detector to Synchrotron Radiation X-Ray Experiments
R. Hashimoto, N. Igarashi, R. Kumai, H. Takagi, S. Kishimoto, T. Kudo, T. Hatsui
Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017
2018

This study explores the application of the SOPHIAS detector in synchrotron-radiation X-ray experiments. The detector enhances data acquisition and imaging performance for advanced experimental studies.

Data Analysis Software
10.7554/eLife.35383
TEM
cisTEM, user-friendly software for single-particle image processing
Timothy Grant, Alexis Rohou, Nikolaus Grigorieff
eLife
2018

cisTEM offers a user-friendly platform for single-particle cryo-EM image processing. Its integrated graphical interface simplifies job management, reconstruction, and high-resolution structure determination.

Simulation Software
10.1016/j.ultramic.2018.06.003
TEM
Dr. Probe: A software for high-resolution STEM image simulation
J. Barthel
Ultramicroscopy
2018

Dr. Probe is presented as a dedicated tool for high-resolution STEM image simulation and analysis. The software aids interpretation of experimental observations by reproducing image formation processes with strong physical realism.

In-Situ TEM Software
10.1093/jmicro/dfy018
TEM
Electric shielding films for biased TEM samples and their application to in situ electron holography
Yuki Nomura, Kazuo Yamamoto, Tsukasa Hirayama, Koh Saitoh
Microscopy
2018

The authors develop electric-shielding films for biased TEM experiments and in-situ electron holography. The methodology improves measurement accuracy when studying electrically active materials.

4D-STEM Software
10.1017/S1431927618003227
TEM
Grains and Strains from Cepstral Analysis of 4D-STEM Nano-Diffraction Datasets
Elliot Padgett, Paul Cueva, Megan E. Holtz, Eric Langenberg, Dong Ren, Hector D. Abruna, Darrell Schlom, David A. Muller
Microscopy and Microanalysis
2018

The authors apply cepstral analysis to 4D-STEM nano-diffraction data for extracting grain orientations and strain information. The technique reveals structural variations across complex materials with high sensitivity.

Data Analysis Software
10.31399/asm.cp.istfa2018p0353
SEM
High-Resolution Resistance Mapping in SEM
Grigore Moldovan, Wolfgang Joachimi, Guillaume Boetsch, Jörg Jatzkowski, Frank Altman
2018

The authors present high-resolution resistance mapping techniques implemented within SEM nanoprobing systems. Advances in instrumentation improve measurement sensitivity, speed, and electrical characterization capabilities.

Data Analysis Software
10.1107/S2059798317017235
X-ray
<i>DIALS</i> : implementation and evaluation of a new integration package
Graeme Winter, David G. Waterman, James M. Parkhurst, Aaron S. Brewster, Richard J. Gildea, Markus Gerstel, Luis Fuentes-Montero, Melanie Vollmar, Tara Michels-Clark, Iris D. Young, Nicholas K. Sauter, Gwyndaf Evans
Acta Crystallographica Section D Structural Biology
2018

DIALS is a software suite for processing crystallographic diffraction data. The package supports spot finding, indexing, refinement, and integration for structural biology and crystallography research.

Data Analysis Software
10.1016/j.talanta.2018.07.083
SEM
Innovative unattended SEM-EDS analysis for asbestos fiber quantification
Roberto Cossio, Carlo Albonico, Andrea Zanella, Silvia Fraterrigo-Garofalo, Chiara Avataneo, Roberto Compagnoni, Francesco Turci
Talanta
2018

This work introduces an unattended SEM-EDS methodology for quantifying asbestos fibers. Automated acquisition and analysis help increase efficiency while maintaining analytical reliability for environmental assessments.

Data Analysis Software
10.1017/S1431927618010152
SEM
In-situ SEM and TEM Nanomechanical Study of Wear and Failure Mechanisms
Sanjit Bhowmick, Eric Hintsala, Douglas Stauffer, S.A. Syed Asif
Microscopy and Microanalysis
2018

This work employs in-situ SEM and TEM nanomechanical testing to examine wear and failure mechanisms at small length scales. Real-time observations provide insight into deformation, damage evolution, and material reliability.

Data Analysis Software
10.1107/S1600577518005787
X-ray
<i>Xi-cam</i> : a versatile interface for data visualization and analysis
Ronald J. Pandolfi, Daniel B. Allan, Elke Arenholz, Luis Barroso-Luque, Stuart I. Campbell, Thomas A. Caswell, Austin Blair, Francesco De Carlo, Sean Fackler, Amanda P. Fournier, Guillaume Freychet, Masafumi Fukuto, Dogˇa Gürsoy, Zhang Jiang, Harinarayan Krishnan, Dinesh Kumar, R. Joseph Kline, Ruipeng Li, Christopher Liman, Stefano Marchesini, Apurva Mehta, Alpha T. N'Diaye, Dilworth Y. Parkinson, Holden Parks, Lenson A. Pellouchoud, Talita Perciano, Fang Ren, Shreya Sahoo, Joseph Strzalka, Daniel Sunday, Christopher J. Tassone, Daniela Ushizima, Singanallur Venkatakrishnan, Kevin G. Yager, Peter Zwart, James A. Sethian, Alexander Hexemer
Journal of Synchrotron Radiation
2018

Xi-cam is a versatile platform for scientific data visualization, management, and analysis. Its extensible architecture supports high-throughput synchrotron workflows and user-defined processing pipelines.

Data Analysis Software
10.4028/www.scientific.net/KEM.761.49
SEM
Multiple Phase Identification in Alkali Activated Slag by SEM-EDS
Najat Alharbi, Richard Hailstone, Benjamin Varela
Key Engineering Materials
2018

The study uses SEM-EDS analysis to identify multiple phases in alkali-activated slag materials. Understanding phase distribution helps explain the properties and performance of these cementitious systems.

Simulation Software
10.1149/MA2018-01/32/1967
TEM
Phase-Field Simulation of Stress Evolution in Sodium Ion Battery Electrode Particles
Tao Zhang, Marc Kamlah
ECS Meeting Abstracts
2018

The authors apply phase-field simulations to investigate stress evolution in sodium-ion battery electrode particles. The model helps explain how phase transformations influence mechanical stability during cycling.

Data Analysis Software
10.1007/978-1-4842-4113-4
X-ray
Python for Data Mining Quick Syntax Reference
Valentina Porcu
2018

This reference provides a concise guide to Python syntax and techniques for data-mining tasks. It serves as a practical resource for data analysis, manipulation, and exploratory workflows.

Simulation Software
10.1098/rsos.171838
TEM
Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials
Karthikeyan Gnanasekaran, Gijsbertus De With, Heiner Friedrich
Royal Society Open Science
2018

The authors quantify and optimize ADF-STEM image contrast for beam-sensitive specimens. Their analysis identifies imaging conditions that maximize information while limiting radiation damage.

Tomography Software
10.1017/S1431927618003276
TEM
Real-Time Tomography with Interactive 3D Visualization using tomviz
Robert Hovden, Jonathan Schwartz, Chris Harris, Cory Quammen, Shawn Waldon, Peter Ercius, Marcus D. Hanwell, Yi Jiang
Microscopy and Microanalysis
2018

This study integrates real-time tomography reconstruction with interactive three-dimensional visualization through tomviz. Users can monitor results during acquisition and rapidly evaluate reconstruction quality.

Data Analysis Software
10.1101/421123
TEM
RELION-3: new tools for automated high-resolution cryo-EM structure determination
Jasenko Zivanov, Takanori Nakane, Björn Forsberg, Dari Kimanius, Wim J.H. Hagen, Erik Lindahl, Sjors H.W. Scheres
2018

RELION-3 expands automated cryo-EM structure determination with new computational tools and performance enhancements. The software improves processing flexibility and supports high-resolution reconstruction pipelines.

Tomography Software
10.1088/1361-6501/aa9dd9
X-ray
Ring artifact reduction in synchrotron x-ray tomography through helical acquisition
Daniël M Pelt, Dilworth Y Parkinson
Measurement Science and Technology
2018

This study presents a method for reducing ring artifacts in synchrotron X-ray tomography through helical acquisition strategies. The technique enhances reconstructed image quality and improves downstream analysis.

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