Correlate nanoscale structural, chemical, and electrical changes with simultaneous closed-loop heating and electrical biasing during in-situ TEM experiments

High-Temperature Heating and Biasing Inside the TEM

The Hummingbird Scientific TEM MEMS Heating + Biasing Sample Holder enables simultaneous high-temperature heating and electrical biasing during in-situ TEM experiments. Microfabricated MEMS chips deliver closed-loop heating above 1000 °C with on-chip temperature sensing, while nine direct-chip electrical contacts support electrical biasing and measurements. Single- and double-tilt configurations provide orientability for a wide range of in-situ materials and device characterization workflows.

Designed for Operando Materials Research and Device Characterization

The system supports operando studies of semiconductor devices, battery materials, catalysts, phase-change materials, low-dimensional materials, nanoparticles, and thin films. Simultaneous heating and electrical biasing enable direct correlation of nanoscale structural, chemical, and electrical changes during phase transformations, electrical transport, nanoscale diffusion, and failure analysis.

Built for Evolving Research Needs

From routine characterization to application-specific experiments, the platform is engineered to expand experimental capability as research evolves. Screw-free direct MEMS chip insertion streamlines sample loading. Standard MEMS Heating, Electrical Biasing, Heating + Biasing, and FIB lift-out MEMS chips support a broad range of experimental requirements, while cross-compatible MEMS chips enable seamless workflows across Hummingbird's TEM, SEM, and synchrotron X-ray platforms. Custom MEMS chip designs further expand the platform to support emerging materials, novel device architectures, and specialized in-situ applications.

TEM MEMS Heating + Biasing Sample Holder

Hummingbird Advantages:

  • Reduce setup time and improve repeatability through industry-leading screw-free direct MEMS chip insertion.
  • Observe high-temperature material transformations with closed-loop MEMS heating above 1000 °C and on-chip temperature sensing.
  • Correlate structural, chemical, and electrical changes using nine direct-chip electrical contacts for simultaneous biasing and electrical measurement.
  • Preserve analytical performance with full EELS and EDS compatibility across the operating temperature range.
  • Optimize imaging conditions with single-tilt or high-accuracy double-tilt holder configurations.
  • Characterize advanced electronic devices and materials using high-voltage and high-frequency electrical biasing with specialized cabling and sample carriers.
  • Expand experimental possibilities with FIB lift-out chips, multiple electrode materials and geometries, and custom MEMS chip designs.
  • Compatible with TEM, SEM, and X-ray microscopy workflows using cross-platform microfabricated chips.
Technical Specs
1550 Series Single-Tilt
1550 Series Double-Tilt
Tilt Range
Up to ± 45° depending on objective pole
Up to ±30° α and ±20° β depending on objective pole
Beta Tilt Accuracy
N/A
<0.01 degree
Electrical Contacts
9 contacts
9 contacts
Contact Type
Direct chip contact
Direct chip contact
Max Operating Temperature
>1000 °C
>1000 °C
Settled Resolution at 1000°C
Up to TEM resolution
Up to TEM resolution
Temperature Stability
100+ hours
100+ hours
Temperature Measurement
4-point resistive sensing
4-point resistive sensing
Special Cabling & Biasing Options
High-voltage or high-frequency biasing options
High-voltage or high-frequency biasing options
EELS / EDS Compatible
Yes
Yes

Available For:

How it Works

The TEM MEMS Heating + Biasing Sample Holder combines Hummingbird Scientific's in-house microfabricated MEMS chips, direct electrical contacts, and closed-loop temperature control to create a stable platform for simultaneous in-situ heating and electrical biasing inside the TEM. Samples are mounted directly onto a MEMS chip and inserted into the holder using a screw-free loading mechanism, enabling fast, reproducible experiment setup.

During operation, the MEMS microheater delivers temperatures up to above 1000 °C, while on-chip 4-point resistance sensing enables closed-loop temperature control for stable real-time imaging and analysis. Heating + Biasing MEMS chips support simultaneous thermal and electrical stimulation, while biasing MEMS chips dedicate all nine contacts to electrical measurements when heating is not required.

The double-tilt configuration adds high-accuracy beta tilt controlled by dedicated tilting software, enabling precise sample orientation for diffraction, crystallographic, and analytical in-situ TEM experiments.

Key Features and Capabilities

Screw-Free Direct Chip Insertion

Load MEMS chips quickly with reliable electrical contact and simplified experiment setup

Nine Low-Noise Electrical Contacts

Perform low-noise in-situ electrical measurements with nine direct chip electrical contacts and individually shielded coaxial cables

Closed-Loop MEMS Heating Above 1000 °C

Achieve stable high-temperature experiments with rapid MEMS heating and precise temperature control alongside concurrent biasing

High-Accuracy and Repeatable Double Tilt

Optimize sample orientation for atomic resolution, zone axis orientation, diffraction, crystallography, and analytical TEM workflows using the double-tilt holder configuration

Multimodal Characterization

Correlate heating, electrical biasing, and imaging data across TEM, SEM, and X-ray microscopy platforms

60+ In-Stock TEM Heating and Biasing Chip Configurations

Keep experiments moving with in-stock MEMS chips for heating, electrical biasing, and advanced in-situ TEM characterization

Optional add-on feature
High-Voltage Biasing

Extend electrical characterization capabilities with specialized biasing hardware and chip configurations for up to 1 kV electrical biasing

Featured Research

Heating-rate-dependence of phase transformations in atomically thin MoS₂ observed by in-situ STEM

The Hummingbird Scientific TEM MEMS Heating + Biasing sample holder was used to directly visualize structural transformations in atomically thin MoS2 during controlled thermal annealing. Using aberration-corrected STEM and a high-frame rate camera, researchers tracked the evolution of the material at the atomic scale at different temperatures. The holder’s rapid and precisely controlled heating capability enabled comparison of equilibrium and non-equilibrium transformation pathways. Fast heating rates produced highly ordered sub-10 nm crystalline islands composed of mixed 2H and 3R phases, while slower heating resulted in nanocrystalline and amorphous structures. These observations revealed how sulfur evaporation and redeposition govern phase evolution in 2DMoS2, providing new insight into the synthesis and engineering of layered nanomaterials.

Reference: Pawan Kumar, et al. npj 2D Materials and Applications (2020).DOI: 10.1038/s41699-020-0150-2

Copyright © 2020 The Author(s). Published under the Creative Commons Attribution 4.0 International License (CC BY 4.0).

Video Spotlight

Atomic-scale diffusion between two quantum dots heated to 650 °C in-situ inside the TEM using the Hummingbird Scientific TEM MEMS Heating + Biasing sample holder. Diffusion proceeds primarily through the bridge until the particles coalesce.

In-situ TEM atomic-scale diffusion between two quantum dots at high temperature

High-temperature in-situ TEM allows researchers to directly observe how nanoscale materials transform under thermal stimulus. In this video, two quantum dots are heated to 650 °C using the Hummingbird Scientific TEM MEMS Heating + Biasing sample holder. Atomic diffusion appears to occur primarily through the bridge between the particles and continues until the two particles coalesce into one larger particle.

This experiment demonstrates why real-time MEMS heating inside the TEM is valuable: researchers can connect temperature, nanoscale structure, diffusion pathway, and final morphology in a single operando experiment rather than relying only on post-mortem characterization.

Hummingbird Advantages

  • Closed-loop MEMS heating enables direct nanoscale observation of thermally activated diffusion.
  • Direct chip contacts and stable MEMS heaters support repeatable high-temperature in-situ TEM experiments.
  • EELS and EDS compatibility can enable correlation of structural and chemical changes when the experiment is configured for analytical microscopy.

Reference: HBS internal/customer data provided by Pawan Kumar, Deep Jariwala, and Eric Stach at the University of Pennsylvania.

High Impact Publications

Trusted by researchers studying 2D materials, phase-change materials, electrical devices, nanocrystals, catalysts, and thin films, the Hummingbird Scientific TEM MEMS Heating + Biasing Sample Holder has supported peer-reviewed in-situ TEM research across advanced materials, high-temperature microscopy, and electrical-biasing workflows.

Observation of Void Formation in Cubic NaYF4 Nanocrystals Using In Situ Heating Transmission Electron Microscopy

Alexander B Bard, Matthew B Lim, Xuezhe Zhou, Julio A Rodríguez Manzo, Daan Hein Alsem, Peter J Pauzauskie

Microscopy and Microanalysis

2019
Mapping Crystallization Kinetics of Phase-Change Materials Over Large Temperature Ranges Using Complementary In Situ Microscopy Techniques

Victoriea L Bird, Al J Rise, Khim Karki, Daan Hein Alsem, Geoffrey H Campbell, Melissa K Santala

Microscopy and Microanalysis

2018
In-Situ TEM Observation of Crystallization in Phase-Change Material

Khim Karki, Victoriea L Bird, Daan Hein Alsem, Melissa K Santala

Microscopy and Microanalysis

2018

Software

Spend less time managing equipment and more time generating results. Hummingbird Control Software provides intuitive control of heating and biasing functions, including temperature set points, closed-loop heating behavior, and voltage sweep workflows when configured with the system.

Hummingbird Connect can support the broader software strategy by connecting holder operation, microscope context, imaging workflows, and experiment metadata. Together, these software tools help improve reproducibility, experiment setup, data organization, and long-term usability for in-situ TEM heating and biasing experiments.

Built on Engineering Excellence

Hummingbird Scientific designs, machines, assembles, tests, and services its products in-house. Our integrated in-house engineering, precision manufacturing, microfabrication, software development, applications, and service teams enable rapid prototyping and iteration, custom modifications, and direct technical support throughout the life of the instrument. This vertically integrated approach allows researchers to adapt experimental platforms to unique scientific requirements while maintaining the performance and reliability required for advanced in-situ microscopy experiments.

The TEM MEMS Heating + Biasing Sample Holder reflects this engineering approach by combining MEMS-based heating, electrical biasing, and integrated holder, chip, and controller technologies into a unified platform for reproducible operando in-situ TEM experiments and advanced materials characterization.

Need something unique? Our engineers can customize existing products or develop new solutions to support specialized MEMS chip designs, electrical configurations, sample geometries, and emerging research challenges.

Frequently Asked Questions

What is a TEM MEMS Heating + Biasing Sample Holder?
What is the TEM MEMS Heating + Biasing sample holder used for?
How many electrical contacts does the TEM MEMS Heating + Biasing Sample Holder provide?
Why use MEMS-based heating instead of conventional heating holders for in-situ TEM?
Can EDS and EELS be performed during heating and biasing using the TEM MEMS Heating + Biasing Sample Holder?
Can the TEM MEMS Heating + Biasing Sample Holder be customized for specialized experimental requirements?
How easy is it to set up and run in-situ TEM heating and biasing experiments using the TEM MEMS Heating + Biasing Sample Holder?
What advantages does the TEM MEMS Heating + Biasing Sample Holder's MEMS chip platform provide?
TEM MEMS Heating + Biasing
Technical Specs
1550 Series Single-Tilt
1550 Series Double-Tilt
Tilt Range
Up to ± 45° depending on objective pole
Up to ±30° α and ±20° β depending on objective pole
Beta Tilt Accuracy
N/A
<0.01 degree
Electrical Contacts
9 contacts
9 contacts
Contact Type
Direct chip contact
Direct chip contact
Max Operating Temperature
>1000 °C
>1000 °C
Settled Resolution at 1000°C
Up to TEM resolution
Up to TEM resolution
Temperature Stability
100+ hours
100+ hours
Temperature Measurement
4-point resistive sensing
4-point resistive sensing
Special Cabling & Biasing Options
High-voltage or high-frequency biasing options
High-voltage or high-frequency biasing options
EELS / EDS Compatible
Yes
Yes
Instrument Type
TEM
TEM

Available For:

Full Product Information
Product Specifications
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High-Voltage Biasing