Name: TEM Biasing Nano-Manipulator
Brand: Hummingbird Scientific

Create site-specific electrical contacts inside the TEM to study nanoscale devices, battery materials, nanowires, and 2D materials while correlating electrical measurements with real-time TEM/STEM characterization

Probe-Based In-Situ Nanomanipulation and Biasing

The TEM Biasing Nano-Manipulator Sample Holder is a probe-based in-situ TEM sample holder that combines precision nanomanipulation with electrical biasing to create site-specific electrical contact inside the TEM. Unlike conventional biasing sample holders that depend on predefined electrical connections, a precision movable probe enables electrical contact to be established and adjusted under direct TEM observation. Researchers can directly correlate localized electrical stimulation and measurements with simultaneous TEM/STEM imaging, electron diffraction, EDS, and EELS.

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Reveal Local Electrical Behavior at the Nanoscale

Investigate electrical transport, interface behavior, electrochemical reactions, and device performance by performing site-specific electrical probing inside the TEM. The holder supports electrical characterization of nanomaterials, semiconductor devices, MEMS structures, FIB-prepared specimens, and battery materials. The movable probe allows different regions and features to be probed, electrically biased, and characterized within a single experiment while maintaining high-resolution TEM and STEM imaging.

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Flexible Electrical Characterization Workflows

The ability to reposition the electrical probe during an experiment gives researchers the freedom to investigate multiple regions, interfaces, and device architectures without changing the specimen or holder configuration. This flexibility increases experimental efficiency, enables adaptive measurement strategies as new features are identified, and supports a wider range of in-situ electrical characterization workflows.

TEM Biasing Nano-Manipulator Sample Holder

Hummingbird Advantages:

Create and adjust site-specific electrical contacts using a precision movable probe with nanometer-scale positioning control.
Achieve accurate probe positioning through uncoupled X, Y, and Z motion.
Investigate local electrical behavior through site-specific electrical probing and concurrent TEM/STEM imaging electron diffraction, EDS, and EELS.
Compare electrical behavior across multiple devices, interfaces, and regions in a single experiment.
Easily replace widely-available standard STM probes to accommodate different experiments and specimen requirements.
Use standard 3 mm half grids, FIB lift-out grids, or custom sample geometries for flexible electrical characterization workflows.
Simplify sample substrate mounting and electrical characterization with a removable sample cartridge and dedicated setup block.

Technical Specs

1800 Series

Probe control

Coarse thumb-screw motion; fine piezoelectric motion

Coarse Movement Range, X axis

>1000 µm

Coarse Movement Range, Y/Z axes

500–1000 µm

Fine Movement Range, X axis

2–3 µm

Fine Movement Range, Y/Z axes

~40 µm

Electrical Contacts

2 standard; 3–7 optional

Electrical Measurement/Control

Integrated voltage source meter

Current Resolution

Down to 1 pA (depending on the choice of electronics)

Sample Compatibility

3 mm half grids; FIB lift-out grids; custom

Available For:

How it Works

The TEM Biasing Nano-Manipulator Sample Holder combines a precision movable electrical probe, independent three-axis nanomanipulation, low-noise electrical connections, and an integrated source meter into a single platform for site-specific electrical characterization inside the TEM. Samples prepared on standard 3 mm half grids, FIB lift-out grids, or custom substrates are mounted in the removable sample cartridge using a dedicated setup block for accurate, repeatable assembly. The cartridge is then installed in the holder, automatically establishing electrical connections while leaving the measurement circuit open.

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During the experiment, the movable probe is positioned using uncoupled piezo-driven coarse and fine motion along the X, Y, and Z axes until it contacts the specimen, completing the electrical circuit under direct TEM observation. Hummingbird Control™ Software provides an intuitive graphical user interface for precise probe control with configurable step sizes and integrated motion compensation to simplify contact formation and optimize probe positioning.

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Once contact is established, researchers can apply electrical bias and acquire low-noise electrical measurements while simultaneously performing TEM/STEM imaging, electron diffraction, EDS, and EELS. The probe can be repositioned throughout the experiment to investigate multiple devices, interfaces, and regions within the same specimen, enabling flexible, site-specific electrical characterization in a single TEM session.

Key Features and Capabilities

Built for Diverse Research Applications

Battery Materials

Directly visualize battery cycling, ion transport, dendrite formation, interface evolution, and structural changes.

Charge-Discharge Cycling

Electrochemistry

Study electrodeposition, electrocatalysis, corrosion mechanisms, and electrochemical interface evolution.

Cyclic Voltammetry (CV)

Linear Sweep Voltammetry (LSV)

Chronoamperometry (CA)

Chronopotentiometry (CP)

Electrochemical Impedance (EIS)

Electronics

Study electrical switching, device reliability, and defect evolution in electronic devices and materials.

Low Dimensional Materials

Study growth, electrochemistry, and structural evolution in 2D materials, nanowires, and quantum dots.

2D Materials Growth

Ion Intercalation

Defect Evolution

Phase Transformations

Surface Chemistry

Featured Research

a) Charge/discharge profiles for interlayer cells. b) In-situ BF-TEM image of the Nanomanipulator probe prior to lithiation. c) Schematics of the cross-sectional morphologies that formed for Cu, Au, Ag, and Zn interlayers.

Operando TEM visualization of lithium plating and stripping in anode-less solid-state batteries

The Hummingbird Scientific TEM Biasing Nano-manipulator was used to directly observe lithium plating and stripping mechanisms in metal-interlayer-inserted anode-less solid-state lithium metal batteries based on Li_6.5La₃Zr_1.5Ta_0.5O₁₂ solid electrolytes. The holder enabled operando electrical biasing and nanoscale imaging during electrochemical reactions, allowing researchers to correlate interfacial morphology changes with battery performance. By comparing Ag, Au, Cu, and Zn interlayers, the study revealed that Ag uniquely promoted stable lithium transport through a lithiated Ag interlayer, suppressing dendritic growth and maintaining interfacial contact during cycling. These operando observations provided direct insight into the influence of interlayer composition on plating behavior and interfacial stability in next-generation solid-state batteries.

Reference: Dong-Su Ko, et al. Nature Communications (2025). DOI:10.1038/s41467-025-55821-1

Abstract

Video Spotlight

Video showing in-situ contact biasing of a nanobattery cell. Lithiation is observed directly upon contact while the novel composite electrode exhibited extroadniary stability during electrical cycling.

In-situ TEM of microstructural evolution in composite solid-state Li-ion batteries during charge/discharge cycles

Researchers at the University of Central Florida (UCF) have studied the structural integrity of a novel composite electrode composed of a polymer-derived ceramic nanoparticle and edge-functionalized graphene oxide during electrochemical lithiation and delithiation cycles.

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They assembled a prototype nanobattery cell with a lithium metal and a SiCNO composite electrode and performed in-situ TEM lithation and delithation for at least two cycles using Hummingbird Scientific’s Biasing Manipulator TEM holder. The observed results demonstrated extraordinary structural stability of the SiCNO nanoparticles with only a 9.36% linear expansion during the lithiation (See Movie on the Left).

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Hummngbird Advantages

Movable probe allows site-specific biasing to observe localized electrochemical transformation
Removable sample carrier with loading block for simplified sample preparation and mounting
Easy exchange of widely-available commercial STM probes
Control software with intuitie graphical user interface

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Reference: Zhang et al. ACS Appl. Mater. Interfaces (2021) DOI: 10.1021/acsami.0c19681

Abstract

High Impact Publications

Explore peer-reviewed publications highlighting the use of the Hummingbird Scientific TEM Biasing Nano-Manipulator Sample Holder for site-specific electrical probing and in-situ TEM investigations of nanoscale materials and devices.

Operando Electrochemical TEM of Solid-State Energy Storage Materials Using a Probe-Based Biasing Holder

Nikhilendra Singh, James Horwath, Alexandre Foucher, Timothy S. Arthur, Julio A. Rodríguez Manzo, Daan Hein Alsem, Eric Stach

Microscopy and Microanalysis

2019

Abstract

Operando Electrochemical TEM of Solid-State Energy Storage Materials Using a Probe-Based Biasing Holder

Nikhilendra Singh, James Horwath, Alexandre Foucher, Timothy S Arthur, Julio A RodrÃguez Manzo, Daan Hein Alsem, Eric Stach

Microscopy and Microanalysis

2019

Abstract

Good Contacts for Quantitative In-Situ TEM Biasing Experiments with Movable Probes

Julio A. Rodriguez Manzo, Daan Hein Alsem, Norman J. Salmon, David Cooper

Microscopy and Microanalysis

2018

Abstract

Facile synthesis and in situ transmission electron microscopy investigation of a highly stable Sb2Te3/C nanocomposite for sodium-ion batteries

Ze Yang, Jingying Sun, Yizhou Ni, Zhenhuan Zhao, Jiming Bao, Shuo Chen

Energy Storage Materials

2017

Abstract

Browse All Publications

Software

Spend less time managing equipment and more time generating results. Hummingbird Control™ Software provides intuitive control of probe positioning and electrical measurements, including multi-axis motion, contact establishment, I–V characterization, voltage sweeps, live current and voltage plotting, and data export.

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Hummingbird Connect™ can support the broader software strategy by connecting holder operation, nanomanipulation workflows, electrical characterization, TEM/STEM imaging, and experiment metadata. Together, these software tools help improve reproducibility, experiment setup, data organization, and long-term usability for probe-based in-situ TEM electrical characterization.

Nanomanipulator Control

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Hummingbird Connect™Hummingbird Control™ Software

Built on Engineering Excellence

Hummingbird Scientific designs, machines, assembles, tests, and services its products in-house. Our integrated in-house engineering, precision manufacturing, microfabrication, software development, applications, and service teams enable rapid prototyping and iteration, custom modifications, and direct technical support throughout the life of the instrument.

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The TEM Biasing Nano-Manipulator Sample Holder reflects this engineering approach by combining precision nanomanipulation, electrical biasing, and controller software and hardware technologies into a unified platform for reproducible in-situ TEM electrical characterization.

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Need something unique? Our engineers can customize existing products or develop new solutions to support specialized probe designs, electrical configurations, sample geometries, and emerging research challenges.

Engineering Process Custom Solutions